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(Single-card) Device perf regressions #3527

(Single-card) Device perf regressions

(Single-card) Device perf regressions #3527

Manually triggered November 13, 2024 14:31
Status Failure
Total duration 1h 2m 43s
Artifacts 2

perf-device-models.yaml

on: workflow_dispatch
build-artifact-profiler  /  ...  /  build-docker-image
18s
build-artifact-profiler / build-docker-image / build-docker-image
Matrix: build-artifact-profiler / build-artifact
Matrix: device-perf / device-perf
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Annotations

6 errors and 8 notices
pcie-cards-are-being-used-cleanup
Tenstorrent cards seem to be in use. Killing PIDs and exiting unsuccessfully. This can happen if a test hung and is normally an issue with the test, rather than infra.
device-perf / GS device perf
Process completed with exit code 1.
device-perf / GS device perf
Process completed with exit code 2.
device-perf / GS device perf
The action 'Run device performance regressions' has timed out after 40 minutes.
device-perf / N300 WH B0 device perf
Process completed with exit code 4.
device-perf / N300 WH B0 device perf
Process completed with exit code 2.
printing-out-smi-info-cleanup
Touching and printing out SMI info
disk-usage-before-startup
Disk usage is 57 %
disk-usage-after-startup
Disk usage is 57 %
printing-smi-info-startup
Touching and printing out SMI info
reset-successful-startup
tt-smi reset was successful
printing-out-smi-info-cleanup
Touching and printing out SMI info
successful-reset-cleanup
tt-smi reset was successful
reset-successful-cleanup
tt-smi reset was successful

Artifacts

Produced during runtime
Name Size
TTMetal_build_grayskull_profiler
56 MB
TTMetal_build_wormhole_b0_profiler
56.3 MB