update

research.html

@@ -63,7 +63,17 @@ <h3>Machine Learning for EDA</h3>
 
 Selected publications:</p>
 <ul>
-<li><p>Chen Bai, <b>Qi Sun#</b>, Jianwang Zhai, Yuzhe Ma, Bei Yu, Martin D.F. Wong, “BOOM-Explorer: RISC-V BOOM Microarchitecture Design Space Exploration”, accepted by ACM Transactions on Design Automation of Electronic Systems (<b>TODAES</b>).</p>
+<li><p>Donger Luo*, <b>Qi Sun*</b>, Xinheng Li, Chen Bai, Bei Yu, Hao Geng, &ldquo;Knowing The Spec to Explore The Design via Transformed Bayesian Optimization&rdquo;, ACM/IEEE Design Automation Conference (DAC), San Francisco, Jun. 23–27, 2024.</p>
+</li>
+<li><p>Yibo Qiao, Weiping Xie, Shunyuan Lou, Qian Jin, Lichao Zeng, Yining Chen#, <b>Qi Sun#</b>, Cheng Zhuo#, &ldquo;Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation&rdquo;,  ACM/IEEE Design Automation Conference (DAC), San Francisco, Jun. 23–27, 2024.</p>
+</li>
+<li><p>Hongquan He, Guowen Kuang, <b>Qi Sun</b>, Hao Geng, &ldquo;Point Cloud and Large Pre-trained Model Catch Mixed-type Wafer Defect Pattern Recognition&rdquo;, IEEE/ACM Proceedings Design, Automation and Test in Europe (<b>DATE</b>), Valencia, Spain, Mar. 25-27, 2024. </p>
+</li>
+<li><p>Donger Luo, <b>Qi Sun</b>, Qi Xu, Tinghuan Chen, Hao Geng, &ldquo;Attention-Based EDA Tool Parameter Explorer: From Hybrid Parameters to Multi-QoR metrics&rdquo;, IEEE/ACM Proceedings Design, Automation and Test in Europe (<b>DATE</b>), Valencia, Spain, Mar. 25-27, 2024. </p>
+</li>
+<li><p>Tinghuan Chen, Hao Geng, <b>Qi Sun</b>, Sanping Wan, Yongsheng Sun, Huatao Yu, Bei Yu, &ldquo;Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization&rdquo;, accepted by ACM Transactions on Design Automation of Electronic Systems (TODAES).</p>
+</li>
+<li><p>Chen Bai, <b>Qi Sun#</b>, Jianwang Zhai, Yuzhe Ma, Bei Yu, Martin D.F. Wong, &ldquo;BOOM-Explorer: RISC-V BOOM Microarchitecture Design Space Exploration&rdquo;, ACM Transactions on Design Automation of Electronic Systems (<b>TODAES</b>), vol. 29, no. 01, pp. 1–23, 2024.</p>
 </li>
 <li><p>Guojin Chen, Wanli Chen, <b>Qi Sun</b>, Yuzhe Ma, Haoyu Yang, Bei Yu, &ldquo;DAMO: Deep Agile Mask Optimization for Full Chip Scale&rdquo;, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (<b>TCAD</b>), vol. 41, no. 9, pp. 3118-3131, Sept. 2022.</p>
 </li>