Add testing with ITC-1600 [backport] #1922
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In a future commit we want to introduce testing with ITC1600 so the current name is too general.
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Only that is available on the test machine.
…for ITC1600 In 7dc07c7 (LNB: Save decimated stim set length for TTL channels, 2023-07-05) we changed the stored stimset lengths to be decimated. But the test assertion for ITC1600 was incorrectly adapted as the sampling interval is different for ITC1600.
…recedence This makes the code easier to understand.
These are in the range [0, 3] as well.
Mention that the channels are GUI channel numbers.
…hardware Since 2637e08 (Add channel types support to EpochsWave as chunk index, 2023-07-07) we have support for exporting epoch information of TTL channels into NWBv2. Unfortunately that commit failed to realize that we have to export TTL information per ttlBit for ITC hardware. As the tests were also wrong, this was found until now with the ITC1600 tests.
…s for ITC rack one This should catch errors better.
The current code did not correctly store the stimsets for ITC hardware if rack one is active with the ITC1600. As fixing it quickly would have made complicated code worse, we rewrote the TTL channel export to be hardware independent.
This was found in the test ExportIntoNWBSweepBySweep [1] and already reported upstream. [1]: https://github.com/AllenInstitute/MIES/actions/runs/6473820032/job/17577887259?pr=1900
… suffix generation in NWB Since 5f0f447 (NWB_AppendSweepLowLevel: Add support for TTL data from NI hardware, 2018-09-12) we don't use the ttlBit as channelSuffix anymore but 2^ttlBit. It is unclear at this point why this was changed. Introduce functions to convert between the two representations to avoid even more confusion in the future.
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Will merge once CI passes and #1900 is approved and merged.