Xianting Lu, Yunong Wang, Yu Fu, Qi Sun, Xuhua Ma, Xudong Zheng, Cheng Zhuo, "MISP: A Multimodal-based Intelligent Server Failure Prediction Model for Cloud Computing Systems", ACM SIGKDD International Conference on Knowledge Discovery and Data Mining (KDD), Barcelona, Spain, Aug. 25-29, 2024.
+Xianting Lu, Yunong Wang, Yu Fu, Qi Sun, Xuhua Ma, Xudong Zheng, Cheng Zhuo, "MISP: A Multimodal-based Intelligent Server Failure Prediction Model for Cloud Computing Systems", ACM SIGKDD International Conference on Knowledge Discovery and Data Mining (KDD), Barcelona, Spain, Aug. 25-29, 2024.
+Lancheng Zou, Wenqian Zhao, Shuo Yin, Chen Bai, Qi Sun#, Bei Yu#, "BiE: Bi-Exponent Block Floating-Point for Large Language Models Quantization", International Conference on Machine Learning (ICML), Vienna, Jul. 21–27, 2024.
Yuqi Jiang, Qian Jin, Xudong Lu, Qi Sun#, Cheng Zhuo, “FabSage: A Large Multimodal Model for IC Defect Detection, Analysis, and Knowledge Querying -”, 1st IEEE International Workshop on LLM-Aided Design, San Jose, CA, June 28-29, 2024.
+”, 1st IEEE International Workshop on LLM-Aided Design (LAD), San Jose, CA, June 28-29, 2024.Donger Luo*, Qi Sun*, Xinheng Li, Chen Bai, Bei Yu, Hao Geng, "Knowing The Spec to Explore The Design via Transformed Bayesian Optimization", ACM/IEEE Design Automation Conference (DAC), San Francisco, Jun. 23–27, 2024.
+Donger Luo*, Qi Sun*, Xinheng Li, Chen Bai, Bei Yu, Hao Geng, "Knowing The Spec to Explore The Design via Transformed Bayesian Optimization", ACM/IEEE Design Automation Conference (DAC), San Francisco, Jun. 23–27, 2024.
Yibo Qiao, Weiping Xie, Shunyuan Lou, Qian Jin, Lichao Zeng, Yining Chen#, Qi Sun#, Cheng Zhuo#, "Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation", ACM/IEEE Design Automation Conference (DAC), San Francisco, Jun. 23–27, 2024.
+Yibo Qiao, Weiping Xie, Shunyuan Lou, Qian Jin, Lichao Zeng, Yining Chen#, Qi Sun#, Cheng Zhuo#, "Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation", ACM/IEEE Design Automation Conference (DAC), San Francisco, Jun. 23–27, 2024.
Hongquan He, Guowen Kuang, Qi Sun, Hao Geng, "Point Cloud and Large Pre-trained Model Catch Mixed-type Wafer Defect Pattern Recognition", IEEE/ACM Proceedings Design, Automation and Test in Europe (DATE), Valencia, Spain, Mar. 25-27, 2024.
E. S. Alcorta, A. Gerstlauer, C. Deng, Q. Sun, Z. Zhang, C. Xu, L. W. Wills, D. S. Lopera, W. Ecker, S. Garg, and J. Hu, "Machine Learning for Embedded System Design", International Conference on Hardware/Software Codesign and System Synthesis (CODES+ISSS), Sep. 2023. (Invited Paper)
Yuxuan Zhao, Qi Sun#, Zhuolun He, Yang Bai, Bei Yu, "AutoGraph: Optimizing DNN Computation Graph for Parallel GPU Kernel Execution", AAAI Conference on Artificial Intelligence (AAAI), Feb. 7–14, 2023.
+Yuxuan Zhao, Qi Sun#, Zhuolun He, Yang Bai, Bei Yu, "AutoGraph: Optimizing DNN Computation Graph for Parallel GPU Kernel Execution", AAAI Conference on Artificial Intelligence (AAAI), Feb. 7–14, 2023.
Xufeng Yao, Yang Bai, Xinyun Zhang, Yuechen Zhang, Qi Sun, Ran Chen, Ruiyu Li, Bei Yu, "PCL: Proxy-based Contrastive Learning for Domain Generalization", IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), New Orleans, Jun. 19–24, 2022.
+Xufeng Yao, Yang Bai, Xinyun Zhang, Yuechen Zhang, Qi Sun, Ran Chen, Ruiyu Li, Bei Yu, "PCL: Proxy-based Contrastive Learning for Domain Generalization", IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), New Orleans, Jun. 19–24, 2022.
Qi Sun, Xinyun Zhang, Hao Geng, Yuxuan Zhao, Yang Bai, Haisheng Zheng, Bei Yu, "GTuner: Tuning DNN Computations on GPU via Graph Attention Network", ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, Jul. 10–14, 2022.