diff --git a/battery-inferred.ttl b/battery-inferred.ttl index a040d25..2e61043 100644 --- a/battery-inferred.ttl +++ b/battery-inferred.ttl @@ -7,7 +7,7 @@ @base . rdf:type owl:Ontology ; - owl:versionIRI ; + owl:versionIRI ; ""@en , "CHAMEO is a domain ontology designed to model the common aspects across the different characterisation techniques and methodologies."@en , """Defines physical quantities in the International System of Quantities (ISQ). ISQ was made an official ISO standard in 2009 and is defined in the ISO/IEC 80000 standard. @@ -152,15 +152,16 @@ The symbolic module includes symbols, symbolic constructs and formal languages." "Characterisation Methodology Ontology"@en ; ; "https://w3id.org/emmo/domain/characterisation-methodology/chameo" ; - "2024-011-07"^^xsd:date , - "2024-04-12" , + "2024-04-12" , "2024-08-14"^^xsd:date , - "2024-11-07"^^xsd:date ; + "2024-11-07"^^xsd:date , + "2024-11-28"^^xsd:date ; "https://creativecommons.org/licenses/by/4.0/legalcode" , "https://creativecommons.org/licenses/by/4.0/legalcode"@en ; "2024-04-12" , "2024-08-14"^^xsd:date , - "2024-11-07"^^xsd:date ; + "2024-11-07"^^xsd:date , + "2024-11-28"^^xsd:date ; "EMMC ASBL" , "EMMC ASBL"@en , """EMMC ASBL @@ -254,16 +255,16 @@ We kindly acknowledge NIST for reusing their content, including the selection of "You can contact EMMO Authors via emmo@emmc.eu"@en ; owl:backwardCompatibleWith "" , " " , - "0.14.0-beta" , - "0.22.0-beta" ; - owl:priorVersion "0.14.0-beta" , - "0.22.0-beta" , + "0.15.0-beta" , + "0.23.0-beta" ; + owl:priorVersion "0.15.0-beta" , + "0.23.0-beta" , "0.7.0-beta" , - "1.0.0-beta2" ; + "1.0.0-beta4" ; owl:versionInfo "0.15.1-beta" , - "0.23.0-beta" , + "0.24.0-beta" , "0.8.0-beta" , - "1.0.0-beta3" , + "1.0.0-beta5" , "1.0.0-beta7" ; "CHAMEO" ; ; @@ -1957,6 +1958,12 @@ While the EMMO FOL introduces the quantum causality relation C(x,y) as primitive "hasAccessConditions"@en . +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasBPMNDiagram + rdf:type owl:ObjectProperty ; + rdfs:subPropertyOf ; + rdfs:range . + + ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasBeginCharacterisationTask rdf:type owl:ObjectProperty ; rdfs:subPropertyOf ; @@ -2002,6 +2009,8 @@ While the EMMO FOL introduces the quantum causality relation C(x,y) as primitive ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationInput rdf:type owl:ObjectProperty ; rdfs:subPropertyOf ; + rdfs:domain ; + rdfs:range ; rdfs:comment "" ; rdfs:label "hasCharacterisationInput"@en ; "hasCharacterizationInput"@en ; @@ -2022,6 +2031,8 @@ While the EMMO FOL introduces the quantum causality relation C(x,y) as primitive ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationOutput rdf:type owl:ObjectProperty ; rdfs:subPropertyOf ; + rdfs:domain ; + rdfs:range ; rdfs:comment "" ; rdfs:label "hasCharacterisationOutput"@en ; "hasCharacterizationOutput"@en ; @@ -2093,7 +2104,7 @@ While the EMMO FOL introduces the quantum causality relation C(x,y) as primitive ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasDataQuality rdf:type owl:ObjectProperty ; rdfs:subPropertyOf ; - rdfs:domain ; + rdfs:domain ; rdfs:range ; rdfs:comment "" ; rdfs:label "hasDataQuality"@en ; @@ -2220,7 +2231,7 @@ While the EMMO FOL introduces the quantum causality relation C(x,y) as primitive ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasMeasurementParameter rdf:type owl:ObjectProperty ; rdfs:subPropertyOf ; - rdfs:domain ; + rdfs:domain ; rdfs:range ; rdfs:comment "" ; rdfs:label "hasMeasurementParameter"@en ; @@ -2288,7 +2299,7 @@ While the EMMO FOL introduces the quantum causality relation C(x,y) as primitive ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasPostProcessingModel rdf:type owl:ObjectProperty ; rdfs:subPropertyOf ; - rdfs:domain ; + rdfs:domain ; rdfs:range ; rdfs:comment "" ; rdfs:label "hasPostProcessingModel"@en ; @@ -2298,7 +2309,7 @@ While the EMMO FOL introduces the quantum causality relation C(x,y) as primitive ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasProcessingReproducibility rdf:type owl:ObjectProperty ; rdfs:subPropertyOf ; - rdfs:domain ; + rdfs:domain ; rdfs:range ; rdfs:comment "" ; rdfs:label "hasProcessingReproducibility"@en ; @@ -2377,13 +2388,26 @@ While the EMMO FOL introduces the quantum causality relation C(x,y) as primitive ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSampledSample rdf:type owl:ObjectProperty ; rdfs:subPropertyOf ; - rdfs:domain ; + rdfs:domain ; rdfs:range ; rdfs:comment "" ; rdfs:label "hasSampledSample"@en ; "hasSampledSample"@en . +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#rationaleHasCharacterisationProcedure + rdf:type owl:ObjectProperty ; + rdfs:subPropertyOf owl:topObjectProperty ; + rdfs:domain ; + rdfs:range . + + +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#rationaleHasUserCase + rdf:type owl:ObjectProperty ; + rdfs:domain ; + rdfs:range . + + ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#requiresLevelOfExpertise rdf:type owl:ObjectProperty ; rdfs:subPropertyOf ; @@ -2393,18 +2417,6 @@ While the EMMO FOL introduces the quantum causality relation C(x,y) as primitive "requiresLevelOfExpertise"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#userCaseHasCharacterisationProcedure - rdf:type owl:ObjectProperty ; - rdfs:subPropertyOf owl:topObjectProperty ; - rdfs:domain ; - rdfs:range ; - rdfs:comment "Used to correlate a user case to a characterisation procedure"@en ; - rdfs:label "userCaseHasCharacterisationProcedure"@en ; - "userCaseHasCharacterizationProcedure"@en ; - "userCaseHasCharacterisationProcedure"@en ; - "Used to correlate a user case to a characterisation procedure"@en . - - ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_056a5fab_3d99_46bd_8eb1_6e89a368e1a7 rdf:type owl:ObjectProperty ; rdfs:subPropertyOf ; @@ -2484,6 +2496,12 @@ While the EMMO FOL introduces the quantum causality relation C(x,y) as primitive "hasReferenceElectrode"@en . +### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_7df82c48_b599_4b02_bef0_9facc9c39410 + rdf:type owl:ObjectProperty ; + rdfs:subPropertyOf ; + "hasAdditive"@en . + + ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_808e94df_e002_4e64_a6db_182ed75078c6 rdf:type owl:ObjectProperty ; rdfs:subPropertyOf ; @@ -7748,6 +7766,7 @@ https://www.computer.org/education/bodies-of-knowledge/software-engineering"""@e ### https://w3id.org/emmo#EMMO_1d6b63d5_9938_483c_ad62_a09ac34153c9 rdf:type owl:Class ; rdfs:subClassOf ; + owl:disjointWith ; rdfs:comment "Cutting workpieces between two cutting edges that move past each other (see Figure 1 [see figure in the standard])." ; "Scherschneiden" ; "ShearCutting"@en . @@ -37466,6 +37485,12 @@ Wikipedia"""@en ; "Atomic force microscopy (AFM) is an influential surface analysis technique used for micro/nanostructured coatings. This flexible technique can be used to obtain high-resolution nanoscale images and study local sites in air (conventional AFM) or liquid (electrochemical AFM) surroundings."@en . +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#BPMNDiagram + rdf:type owl:Class ; + rdfs:subClassOf ; + "BPMNDiagram" . + + ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#BrunauerEmmettTellerMethod rdf:type owl:Class ; rdfs:subClassOf ; @@ -37487,18 +37512,17 @@ Wikipedia"""@en ; "Calibration data are used to provide correction of measured data or perform uncertainty calculations. They are generally the result of a measuerement on a reference specimen."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CalibrationDataPostProcessing - rdf:type owl:Class ; - rdfs:subClassOf ; - rdfs:comment "Post-processing of the output of the calibration in order to get the actual calibration data to be used as input for the measurement."@en ; - rdfs:label "CalibrationDataPostProcessing"@en ; - "CalibrationDataPostProcessing"@en ; - "Post-processing of the output of the calibration in order to get the actual calibration data to be used as input for the measurement."@en . - - ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CalibrationProcess rdf:type owl:Class ; rdfs:subClassOf , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , [ rdf:type owl:Restriction ; owl:onProperty ; owl:someValuesFrom @@ -37530,20 +37554,6 @@ standards. "Usually the calibration process involve a reference sample (with pre-defined, specific, and stable physical characteristics and known properties), in order to extract calibration data. In this way, the accuracy of the measurement tool and its components (for example the probe) will be evaluated and confirmed."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CalibrationTask - rdf:type owl:Class ; - rdfs:subClassOf , - [ rdf:type owl:Restriction ; - owl:onProperty [ owl:inverseOf - ] ; - owl:someValuesFrom - ] ; - rdfs:comment "Used to break-down a CalibrationProcess into his specific tasks."@en ; - rdfs:label "CalibrationTask" ; - "CalibrationTask" ; - "Used to break-down a CalibrationProcess into his specific tasks."@en . - - ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Calorimetry rdf:type owl:Class ; rdfs:subClassOf ; @@ -37728,20 +37738,6 @@ system specifications. "Measurement"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationMeasurementTask - rdf:type owl:Class ; - rdfs:subClassOf , - [ rdf:type owl:Restriction ; - owl:onProperty [ owl:inverseOf - ] ; - owl:someValuesFrom - ] ; - rdfs:comment "Used to break-down a CharacterisationMeasurementProcess into his specific tasks."@en ; - rdfs:label "CharacterisationMeasurementTask"@en ; - "CharacterisationMeasurementTask"@en ; - "Used to break-down a CharacterisationMeasurementProcess into his specific tasks."@en . - - ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationProcedure rdf:type owl:Class ; rdfs:subClassOf ; @@ -37769,9 +37765,7 @@ Data sampling"""@en ; ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationProperty rdf:type owl:Class ; - rdfs:subClassOf , - , - ; + rdfs:subClassOf ; rdfs:comment "The characterisation property is the investigate property or behaviour of a sample. It is derived from the secondary data, usually after classification or quantification (manually or by a model)."@en ; rdfs:label "CharacterisationProperty"@en ; "CharacterisationProperty"@en ; @@ -37845,13 +37839,13 @@ NOTE 4 A measuring system can be used as a measurement standard."""@en ; ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationTechnique rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "The description of the overall characterisation method. It can be composed of different steps (e.g. sample preparation, calibration, measurement, post-processing)."@en ; + rdfs:comment "The description of the overall characterisation technique. It can be composed of different steps (e.g. sample preparation, calibration, measurement, post-processing)."@en ; rdfs:label "CharacterisationTechnique"@en ; "Characterisation procedure"@en , "Characterisation technique"@en ; "CharacterisationTechnique"@en ; - "The description of the overall characterisation method. It can be composed of different steps (e.g. sample preparation, calibration, measurement, post-processing)."@en ; - "A characterisation method is not only related to the measurement process which can be one of its steps." . + "The description of the overall characterisation technique. It can be composed of different steps (e.g. sample preparation, calibration, measurement, post-processing)."@en ; + "A characterisation technique is not only related to the measurement process which can be one of its steps." . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationWorkflow @@ -38242,39 +38236,37 @@ NOTE 4 A measuring system can be used as a measurement standard."""@en ; ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DirectCoulometryAtControlledCurrent rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" , - "Direct coulometry at controlled current is usually carried out in convective mass transfer mode. The end-point of the electrolysis, at which the current is stopped, must be determined either from the inflection point in the E–t curve or by using visual or objective end-point indi- cation, similar to volumetric methods. The total electric charge is calculated as the product of the constant current and time of electrolysis or can be measured directly using a coulometer."@en , - "The advantage of this method is that the electric charge consumed during the electrode reaction is directly proportional to the electrolysis time. Care must be taken to avoid the potential region where another electrode reaction may occur."@en ; + rdfs:comment "Coulometry at an imposed, constant current in the electrochemical cell. Direct coulometry at controlled current is usually carried out in convective mass transfer mode. The end-point of the electrolysis, at which the current is stopped, must be determined either from the inflection point in the E–t curve or by using visual or objective end-point indi- cation, similar to volumetric methods. The total electric charge is calculated as the product of the constant current and time of electrolysis or can be measured directly using a coulometer. The advantage of this method is that the electric charge consumed during the electrode reaction is directly proportional to the electrolysis time. Care must be taken to avoid the potential region where another electrode reaction may occur."@en ; rdfs:label "DirectCoulometryAtControlledCurrent"@en ; "DirectCoulometryAtControlledCurrent"@en ; - "coulometry at an imposed, constant current in the electrochemical cell"@en . + "Coulometry at an imposed, constant current in the electrochemical cell. Direct coulometry at controlled current is usually carried out in convective mass transfer mode. The end-point of the electrolysis, at which the current is stopped, must be determined either from the inflection point in the E–t curve or by using visual or objective end-point indi- cation, similar to volumetric methods. The total electric charge is calculated as the product of the constant current and time of electrolysis or can be measured directly using a coulometer. The advantage of this method is that the electric charge consumed during the electrode reaction is directly proportional to the electrolysis time. Care must be taken to avoid the potential region where another electrode reaction may occur."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DirectCoulometryAtControlledPotential rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" , - "Direct coulometry at controlled potential is usually carried out in convective mass trans- fer mode using a large surface working electrode. Reference and auxiliary electrodes are placed in separate compartments. The total electric charge is obtained by integration of the I–t curve or can be measured directly using a coulometer."@en , + rdfs:comment "Coulometry at a preselected constant potential of the working electrode. Direct coulometry at controlled potential is usually carried out in convective mass trans- fer mode using a large surface working electrode. Reference and auxiliary electrodes are placed in separate compartments. The total electric charge is obtained by integration of the I–t curve or can be measured directly using a coulometer."@en , "In principle, the end point at which I = 0, i.e. when the concentration of species under study becomes zero, can be reached only at infinite time. However, in practice, the electrolysis is stopped when the current has decayed to a few percent of the initial value and the charge passed at infinite time is calculated from a plot of charge Q(t) against time t. For a simple system under diffusion control Qt= Q∞[1 − exp(−DAt/Vδ)], where Q∞ = limt→∞Q(t) is the total charge passed at infinite time, D is the diffusion coefficient of the electroactive species, A the electrode area, δ the diffusion layer thickness, and V the volume of the solution."@en ; rdfs:label "DirectCoulometryAtControlledPotential"@en ; "DirectCoulometryAtControlledPotential"@en ; - "coulometry at a preselected constant potential of the working electrode"@en ; + "Coulometry at a preselected constant potential of the working electrode. Direct coulometry at controlled potential is usually carried out in convective mass trans- fer mode using a large surface working electrode. Reference and auxiliary electrodes are placed in separate compartments. The total electric charge is obtained by integration of the I–t curve or can be measured directly using a coulometer."@en , + "In principle, the end point at which I = 0, i.e. when the concentration of species under study becomes zero, can be reached only at infinite time. However, in practice, the electrolysis is stopped when the current has decayed to a few percent of the initial value and the charge passed at infinite time is calculated from a plot of charge Q(t) against time t. For a simple system under diffusion control Qt= Q∞[1 − exp(−DAt/Vδ)], where Q∞ = limt→∞Q(t) is the total charge passed at infinite time, D is the diffusion coefficient of the electroactive species, A the electrode area, δ the diffusion layer thickness, and V the volume of the solution."@en ; "https://doi.org/10.1515/pac-2018-0109"@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DirectCurrentInternalResistance rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Method of determining the internal resistance of an electrochemical cell by applying a low current followed by higher current within a short period, and then record the changes of battery voltage and current."@en ; rdfs:label "DirectCurrentInternalResistance"@en ; "DirectCurrentInternalResistance"@en ; - "method of determining the internal resistance of an electrochemical cell by applying a low current followed by higher current within a short period, and then record the changes of battery voltage and current"@en . + "Method of determining the internal resistance of an electrochemical cell by applying a low current followed by higher current within a short period, and then record the changes of battery voltage and current."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DynamicLightScattering rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Dynamic light scattering (DLS) is a technique in physics that can be used to determine the size distribution profile of small particles in suspension or polymers in solution. In the scope of DLS, temporal fluctuations are usually analyzed using the intensity or photon auto-correlation function (also known as photon correlation spectroscopy - PCS or quasi-elastic light scattering - QELS)."@en ; rdfs:label "DynamicLightScattering"@en ; "DLS" ; "DynamicLightScattering"@en ; @@ -38284,7 +38276,7 @@ NOTE 4 A measuring system can be used as a measurement standard."""@en ; ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DynamicMechanicalAnalysis rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Dynamic mechanical analysis (abbreviated DMA) is a characterisation technique where a sinusoidal stress is applied and the strain in the material is measured, allowing one to determine the complex modulus. The temperature of the sample or the frequency of the stress are often varied, leading to variations in the complex modulus; this approach can be used to locate the glass transition temperature[1] of the material, as well as to identify transitions corresponding to other molecular motions."@en ; rdfs:label "DynamicMechanicalAnalysis"@en ; "DynamicMechanicalAnalysis"@en ; "Dynamic mechanical analysis (abbreviated DMA) is a characterisation technique where a sinusoidal stress is applied and the strain in the material is measured, allowing one to determine the complex modulus. The temperature of the sample or the frequency of the stress are often varied, leading to variations in the complex modulus; this approach can be used to locate the glass transition temperature[1] of the material, as well as to identify transitions corresponding to other molecular motions."@en . @@ -38293,7 +38285,7 @@ NOTE 4 A measuring system can be used as a measurement standard."""@en ; ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DynamicMechanicalSpectroscopy rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Dynamic Mechanical Analysis (DMA) is a material characterization technique where a small deformation is applied to a sample in a cyclic manner. This allows measurement of the materials response to stress, temperature, frequency or time. The term is also used to refer to the analyzer that performs the test."@en ; rdfs:label "DynamicMechanicalSpectroscopy"@en ; "DMA" ; "DynamicMechanicalSpectroscopy"@en ; @@ -38319,47 +38311,45 @@ NOTE 4 A measuring system can be used as a measurement standard."""@en ; ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectrochemicalImpedanceSpectroscopy rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" , - "Impedimetric sensors are based on measurement of a concentration-dependent parameter taken from analysis of the respective electrochemical impedance spectra, or from the impedance magnitudes at a chosen fixed frequency."@en , - "The sinusoidal current response lags behind the sinusoidal voltage perturbation by a phase angle φ. Resistances (e.g. to charge transfer) give a response in phase with the voltage perturbation; capacitances (e.g. double layer) give a response 90° out of phase; combinations of resistances and capacitances give phase angles between 0 and 90°. Plots of the out of phase vs. the in phase component of the impedance for all the frequencies tested are called complex plane (or Nyquist) plots. Plots of the phase angle and the magnitude of the impedance vs. the logarithm of perturbation frequency are called Bode diagrams. Complex plane plots are the more commonly used for electrochemical sensors."@en ; + rdfs:comment "Electrochemical measurement method of the complex impedance of an electrochemical system as a function of the frequency of a small amplitude (normally 5 to 10 mV) sinusoidal voltage perturbation superimposed on a fixed value of applied potential or on the open circuit potential. Impedimetric sensors are based on measurement of a concentration-dependent parameter taken from analysis of the respective electrochemical impedance spectra, or from the impedance magnitudes at a chosen fixed frequency. The sinusoidal current response lags behind the sinusoidal voltage perturbation by a phase angle φ. Resistances (e.g. to charge transfer) give a response in phase with the voltage perturbation; capacitances (e.g. double layer) give a response 90° out of phase; combinations of resistances and capacitances give phase angles between 0 and 90°. Plots of the out of phase vs. the in phase component of the impedance for all the frequencies tested are called complex plane (or Nyquist) plots. Plots of the phase angle and the magnitude of the impedance vs. the logarithm of perturbation frequency are called Bode diagrams. Complex plane plots are the more commonly used for electrochemical sensors."@en ; rdfs:label "ElectrochemicalImpedanceSpectroscopy"@en ; "EIS"@en ; "ElectrochemicalImpedanceSpectroscopy"@en ; "https://www.wikidata.org/wiki/Q3492904"@en ; - "electrochemical measurement method of the complex impedance of an electrochemical system as a function of the frequency of a small amplitude (normally 5 to 10 mV) sinusoidal voltage perturbation superimposed on a fixed value of applied potential or on the open circuit potential"@en ; + "Electrochemical measurement method of the complex impedance of an electrochemical system as a function of the frequency of a small amplitude (normally 5 to 10 mV) sinusoidal voltage perturbation superimposed on a fixed value of applied potential or on the open circuit potential. Impedimetric sensors are based on measurement of a concentration-dependent parameter taken from analysis of the respective electrochemical impedance spectra, or from the impedance magnitudes at a chosen fixed frequency. The sinusoidal current response lags behind the sinusoidal voltage perturbation by a phase angle φ. Resistances (e.g. to charge transfer) give a response in phase with the voltage perturbation; capacitances (e.g. double layer) give a response 90° out of phase; combinations of resistances and capacitances give phase angles between 0 and 90°. Plots of the out of phase vs. the in phase component of the impedance for all the frequencies tested are called complex plane (or Nyquist) plots. Plots of the phase angle and the magnitude of the impedance vs. the logarithm of perturbation frequency are called Bode diagrams. Complex plane plots are the more commonly used for electrochemical sensors."@en ; "https://doi.org/10.1515/pac-2018-0109"@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectrochemicalPiezoelectricMicrogravimetry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" , - "The change of mass is, for rigid deposits, linearly proportional to the change of the reso- nance frequency of the quartz crystal, according to the Sauerbrey equation. For non- rigid deposits, corrections must be made."@en ; + rdfs:comment "Electrogravimetry using an electrochemical quartz crystal microbalance. The change of mass is, for rigid deposits, linearly proportional to the change of the reso- nance frequency of the quartz crystal, according to the Sauerbrey equation. For non- rigid deposits, corrections must be made."@en ; rdfs:label "ElectrochemicalPiezoelectricMicrogravimetry"@en ; "ElectrochemicalPiezoelectricMicrogravimetry"@en ; - "Electrogravimetry using an electrochemical quartz crystal microbalance."@en ; + "Electrogravimetry using an electrochemical quartz crystal microbalance. The change of mass is, for rigid deposits, linearly proportional to the change of the reso- nance frequency of the quartz crystal, according to the Sauerbrey equation. For non- rigid deposits, corrections must be made."@en ; "https://doi.org/10.1515/pac-2018-0109"@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectrochemicalTesting rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "In electrochemical characterization, the measurement of potential, charge, or current is used to determine an analyte's concentration or to characterize an analyte's chemical reactivity"@en ; rdfs:label "ElectrochemicalTesting"@en ; rdfs:seeAlso "http://dx.doi.org/10.1016/B978-0-323-46140-5.00002-9" ; "ElectrochemicalTesting"@en ; - "In electrochemical characterization, the measurement of potential, charge, or current is used to determine an analyte's concentration or to characterize an analyte's chemical reactivity"@en . + "In electrochemical characterization, the measurement of potential, charge, or current is used to determine an analyte's concentration or to characterize an analyte's chemical reactivity."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Electrogravimetry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Method of electroanalytical chemistry used to separate by electrolyse ions of a substance and to derive the amount of this substance from the increase in mass of an electrode."@en ; rdfs:label "Electrogravimetry"@en ; "Electrogravimetry"@en ; "https://www.wikidata.org/wiki/Q902953" ; "https://www.electropedia.org/iev/iev.nsf/display?openform&ievref=114-04-14"@en ; - "method of electroanalytical chemistry used to separate by electrolyse ions of a substance and to derive the amount of this substance from the increase in mass of an electrode."@en ; + "Method of electroanalytical chemistry used to separate by electrolyse ions of a substance and to derive the amount of this substance from the increase in mass of an electrode."@en , + "method of electroanalytical chemistry used to separate by electrolyse ions of a substance and to derive the amount of this substance from the increase in mass of an electrode."@en ; "https://en.wikipedia.org/wiki/Electrogravimetry"@en . [ rdf:type owl:Axiom ; @@ -38374,7 +38364,7 @@ NOTE 4 A measuring system can be used as a measurement standard."""@en ; rdf:type owl:Class ; rdfs:subClassOf , ; - rdfs:comment "" ; + rdfs:comment "Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In this configuration, the SEM incident beam hits the tilted sample. As backscattered electrons leave the sample, they interact with the crystal's periodic atomic lattice planes and diffract according to Bragg's law at various scattering angles before reaching the phosphor screen forming Kikuchi patterns (EBSPs). EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. Thus, EBSPs can be indexed to provide information about the material's grain structure, grain orientation, and phase at the micro-scale. EBSD is applied for impurities and defect studies, plastic deformation, and statistical analysis for average misorientation, grain size, and crystallographic texture. EBSD can also be combined with energy-dispersive X-ray spectroscopy (EDS), cathodoluminescence (CL), and wavelength-dispersive X-ray spectroscopy (WDS) for advanced phase identification and materials discovery."@en ; rdfs:label "ElectronBackscatterDiffraction"@en ; "EBSD" ; "ElectronBackscatterDiffraction"@en ; @@ -38384,7 +38374,7 @@ NOTE 4 A measuring system can be used as a measurement standard."""@en ; ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronProbeMicroanalysis rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers."@en ; rdfs:label "ElectronProbeMicroanalysis"@en ; "ElectronProbeMicroanalysis"@en ; "Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers."@en . @@ -38393,21 +38383,16 @@ NOTE 4 A measuring system can be used as a measurement standard."""@en ; ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Ellipsometry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Ellipsometry is an optical technique that uses polarised light to probe the dielectric properties of a sample (optical system). The common application of ellipsometry is the analysis of thin films. Through the analysis of the state of polarisation of the light that is reflected from the sample, ellipsometry yields information on the layers that are thinner than the wavelength of the light itself, down to a single atomic layer or less. Depending on what is already known about the sample, the technique can probe a range of properties including layer thickness, morphology, and chemical composition."@en ; rdfs:label "Ellipsometry"@en ; "Ellipsometry"@en ; - """Ellipsometry is an optical technique that uses polarised light to probe the dielectric -properties of a sample (optical system). The common application of ellipsometry is -the analysis of thin films. Through the analysis of the state of polarisation of the -light that is reflected from the sample, ellipsometry yields information on the layers that are thinner than the wavelength of the light itself, down to a single atomic -layer or less. Depending on what is already known about the sample, the technique -can probe a range of properties including layer thickness, morphology, and chemical composition."""@en . + "Ellipsometry is an optical technique that uses polarised light to probe the dielectric properties of a sample (optical system). The common application of ellipsometry is the analysis of thin films. Through the analysis of the state of polarisation of the light that is reflected from the sample, ellipsometry yields information on the layers that are thinner than the wavelength of the light itself, down to a single atomic layer or less. Depending on what is already known about the sample, the technique can probe a range of properties including layer thickness, morphology, and chemical composition."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#EnergyDispersiveXraySpectroscopy rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "An analytical technique used for the elemental analysis or chemical characterization of a sample."@en ; rdfs:label "EnergyDispersiveXraySpectroscopy"@en ; "EDS"@en , "EDX"@en ; @@ -38420,7 +38405,7 @@ can probe a range of properties including layer thickness, morphology, and chemi ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#EnvironmentalScanningElectronMicroscopy rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber."@en ; rdfs:label "EnvironmentalScanningElectronMicroscopy"@en ; "EnvironmentalScanningElectronMicroscopy"@en ; "The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber."@en . @@ -38429,17 +38414,16 @@ can probe a range of properties including layer thickness, morphology, and chemi ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Exafs rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Extended X-ray absorption fine structure (EXAFS), along with X-ray absorption near edge structure (XANES), is a subset of X-ray absorption spectroscopy (XAS). Like other absorption spectroscopies, XAS techniques follow Beer's law. The X-ray absorption coefficient of a material as a function of energy is obtained by directing X-rays of a narrow energy range at a sample, while recording the incident and transmitted x-ray intensity, as the incident x-ray energy is incremented. When the incident x-ray energy matches the binding energy of an electron of an atom within the sample, the number of x-rays absorbed by the sample increases dramatically, causing a drop in the transmitted x-ray intensity. This results in an absorption edge. Every element has a set of unique absorption edges corresponding to different binding energies of its electrons, giving XAS element selectivity. XAS spectra are most often collected at synchrotrons because of the high intensity of synchrotron X-ray sources allow the concentration of the absorbing element to reach as low as a few parts per million. Absorption would be undetectable if the source is too weak. Because X-rays are highly penetrating, XAS samples can be gases, solids or liquids."@en ; rdfs:label "Exafs"@en ; "Exafs"@en ; - """Extended X-ray absorption fine structure (EXAFS), along with X-ray absorption near edge structure (XANES), is a subset of X-ray absorption spectroscopy (XAS). Like other absorption spectroscopies, XAS techniques follow Beer's law. The X-ray absorption coefficient of a material as a function of energy is obtained by directing X-rays of a narrow energy range at a sample, while recording the incident and transmitted x-ray intensity, as the incident x-ray energy is incremented. -When the incident x-ray energy matches the binding energy of an electron of an atom within the sample, the number of x-rays absorbed by the sample increases dramatically, causing a drop in the transmitted x-ray intensity. This results in an absorption edge. Every element has a set of unique absorption edges corresponding to different binding energies of its electrons, giving XAS element selectivity. XAS spectra are most often collected at synchrotrons because of the high intensity of synchrotron X-ray sources allow the concentration of the absorbing element to reach as low as a few parts per million. Absorption would be undetectable if the source is too weak. Because X-rays are highly penetrating, XAS samples can be gases, solids or liquids."""@en . + "Extended X-ray absorption fine structure (EXAFS), along with X-ray absorption near edge structure (XANES), is a subset of X-ray absorption spectroscopy (XAS). Like other absorption spectroscopies, XAS techniques follow Beer's law. The X-ray absorption coefficient of a material as a function of energy is obtained by directing X-rays of a narrow energy range at a sample, while recording the incident and transmitted x-ray intensity, as the incident x-ray energy is incremented. When the incident x-ray energy matches the binding energy of an electron of an atom within the sample, the number of x-rays absorbed by the sample increases dramatically, causing a drop in the transmitted x-ray intensity. This results in an absorption edge. Every element has a set of unique absorption edges corresponding to different binding energies of its electrons, giving XAS element selectivity. XAS spectra are most often collected at synchrotrons because of the high intensity of synchrotron X-ray sources allow the concentration of the absorbing element to reach as low as a few parts per million. Absorption would be undetectable if the source is too weak. Because X-rays are highly penetrating, XAS samples can be gases, solids or liquids."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#FatigueTesting rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Fatigue testing is a specialised form of mechanical testing that is performed by applying cyclic loading to a coupon or structure. These tests are used either to generate fatigue life and crack growth data, identify critical locations or demonstrate the safety of a structure that may be susceptible to fatigue."@en ; rdfs:label "FatigueTesting"@en ; "FatigueTesting"@en ; "Fatigue testing is a specialised form of mechanical testing that is performed by applying cyclic loading to a coupon or structure. These tests are used either to generate fatigue life and crack growth data, identify critical locations or demonstrate the safety of a structure that may be susceptible to fatigue."@en . @@ -38448,7 +38432,7 @@ When the incident x-ray energy matches the binding energy of an electron of an a ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#FibDic rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "The FIB-DIC (Focused Ion Beam - Digital Image Correlation) ring-core technique is a powerful method for measuring residual stresses in materials. It is based on milling a ring-shaped sample, or core, from the material of interest using a focused ion beam (FIB)."@en ; rdfs:label "FibDic" ; "FIBDICResidualStressAnalysis" ; "FibDic" ; @@ -38458,7 +38442,7 @@ When the incident x-ray energy matches the binding energy of an electron of an a ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used for imaging."@en ; rdfs:label "FieldEmissionScanningElectronMicroscopy"@en ; "FE-SEM" ; "FieldEmissionScanningElectronMicroscopy"@en ; @@ -38468,7 +38452,7 @@ When the incident x-ray energy matches the binding energy of an electron of an a ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#FourierTransformInfraredSpectroscopy rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "A technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid, or gas"@en ; rdfs:label "FourierTransformInfraredSpectroscopy"@en ; "FTIR"@en ; "FourierTransformInfraredSpectroscopy"@en ; @@ -38480,16 +38464,16 @@ When the incident x-ray energy matches the binding energy of an electron of an a ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Fractography rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Fractography is the study of fracture surfaces in order to determine the relation between the microstructure and the mechanism(s) of crack initiation and propagation and, eventually, the root cause of the fracture. Fractography qualitatively interprets the mechanisms of fracture that occur in a sample by microscopic examination of fracture surface morpholog."@en ; rdfs:label "Fractography"@en ; "Fractography"@en ; - "Fractography is the study of fracture surfaces in order to determine the relation between the microstructure and the mechanism(s) of crack initiation and propagation and, eventually, the root cause of the fracture .Fractography qualitatively interprets the mechanisms of fracture that occur in a sample by microscopic examination of fracture surface morpholog."@en . + "Fractography is the study of fracture surfaces in order to determine the relation between the microstructure and the mechanism(s) of crack initiation and propagation and, eventually, the root cause of the fracture. Fractography qualitatively interprets the mechanisms of fracture that occur in a sample by microscopic examination of fracture surface morpholog."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#FreezingPointDepressionOsmometry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "The general principle of freezing point depression osmometry involves the relationship between the number of moles of dissolved solute in a solution and the change in freezing point."@en ; rdfs:label "FreezingPointDepressionOsmometry"@en ; "FreezingPointDepressionOsmometry"@en ; "The general principle of freezing point depression osmometry involves the relationship between the number of moles of dissolved solute in a solution and the change in freezing point."@en . @@ -38498,52 +38482,57 @@ When the incident x-ray energy matches the binding energy of an electron of an a ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#GalvanostaticIntermittentTitrationTechnique rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Electrochemical method that applies current pulses to an electrochemical cell at rest and measures the voltage response."@en ; rdfs:label "GalvanostaticIntermittentTitrationTechnique"@en ; "GITT"@en ; "GalvanostaticIntermittentTitrationTechnique"@en ; "https://www.wikidata.org/wiki/Q120906986" ; - "electrochemical method that applies current pulses to an electrochemical cell at rest and measures the voltage response"@en . + "Electrochemical method that applies current pulses to an electrochemical cell at rest and measures the voltage response."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#GammaSpectrometry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Gamma-ray spectroscopy is the qualitative study of the energy spectra of gamma-ray sources, such as in the nuclear industry, geochemical investigation, and astrophysics.[1] Gamma-ray spectrometry, on the other hand, is the method used to acquire a quantitative spectrum measurement. Most radioactive sources produce gamma rays, which are of various energies and intensities. When these emissions are detected and analyzed with a spectroscopy system, a gamma-ray energy spectrum can be produced. A detailed analysis of this spectrum is typically used to determine the identity and quantity of gamma emitters present in a gamma source, and is a vital tool in radiometric assay. The gamma spectrum is characteristic of the gamma-emitting nuclides contained in the source, just like in an optical spectrometer, the optical spectrum is characteristic of the material contained in a sample."@en ; rdfs:label "GammaSpectrometry"@en ; "GammaSpectrometry"@en ; - """Gamma-ray spectroscopy is the qualitative study of the energy spectra of gamma-ray sources, such as in the nuclear industry, geochemical investigation, and astrophysics.[1] Gamma-ray spectrometry, on the other hand, is the method used to acquire a quantitative spectrum measurement.[2] - -Most radioactive sources produce gamma rays, which are of various energies and intensities. When these emissions are detected and analyzed with a spectroscopy system, a gamma-ray energy spectrum can be produced. - -A detailed analysis of this spectrum is typically used to determine the identity and quantity of gamma emitters present in a gamma source, and is a vital tool in radiometric assay. The gamma spectrum is characteristic of the gamma-emitting nuclides contained in the source, just like in an optical spectrometer, the optical spectrum is characteristic of the material contained in a sample."""@en . + "Gamma-ray spectroscopy is the qualitative study of the energy spectra of gamma-ray sources, such as in the nuclear industry, geochemical investigation, and astrophysics.[1] Gamma-ray spectrometry, on the other hand, is the method used to acquire a quantitative spectrum measurement. Most radioactive sources produce gamma rays, which are of various energies and intensities. When these emissions are detected and analyzed with a spectroscopy system, a gamma-ray energy spectrum can be produced. A detailed analysis of this spectrum is typically used to determine the identity and quantity of gamma emitters present in a gamma source, and is a vital tool in radiometric assay. The gamma spectrum is characteristic of the gamma-emitting nuclides contained in the source, just like in an optical spectrometer, the optical spectrum is characteristic of the material contained in a sample."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#GasAdsorptionPorosimetry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Gas Adsorption Porosimetry is a method used for analyzing the surface area and porosity of materials. In this method, a gas, typically nitrogen or argon, is adsorbed onto the surface of the material at various pressures and temperatures."@en ; rdfs:label "GasAdsorptionPorosimetry"@en ; "GasAdsorptionPorosimetry" ; "GasAdsorptionPorosimetry"@en ; "Gas Adsorption Porosimetry is a method used for analyzing the surface area and porosity of materials. In this method, a gas, typically nitrogen or argon, is adsorbed onto the surface of the material at various pressures and temperatures."@en . +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Grinding + rdf:type owl:Class ; + rdfs:subClassOf ; + rdfs:comment "Grinding is a machining process that involves the use of a disc-shaped grinding wheel to remove material from a workpiece. There are several types of grinding wheels, some of which include grindstones, angle grinders, die grinders and specialized grinding machines."@en ; + rdfs:label "Grinding"@en ; + "Grinding"@en ; + "Grinding is a machining process that involves the use of a disc-shaped grinding wheel to remove material from a workpiece. There are several types of grinding wheels, some of which include grindstones, angle grinders, die grinders and specialized grinding machines."@en . + + ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#HPPC rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Electrochemical method that measures the voltage drop of a cell resulting from a square wave current load."@en ; rdfs:label "HPPC"@en ; "HybridPulsePowerCharacterisation"@en , "HybridPulsePowerCharacterization"@en ; "HPPC"@en ; - "electrochemical method that measures the voltage drop of a cell resulting from a square wave current load"@en . + "Electrochemical method that measures the voltage drop of a cell resulting from a square wave current load."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#HardnessTesting rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "A test to determine the resistance a material exhibits to permanent deformation by penetration of another harder material."@en ; rdfs:label "HardnessTesting"@en ; "HardnessTesting"@en ; "A test to determine the resistance a material exhibits to permanent deformation by penetration of another harder material."@en . @@ -38552,7 +38541,7 @@ A detailed analysis of this spectrum is typically used to determine the identity ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Hazard rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Set of inherent properties of a substance, mixture of substances, or a process involving substances that, under production, usage, or disposal conditions, make it capable of causing adverse effects to organisms or the environment, depending on the degree of exposure; in other words, it is a source of danger."@en ; rdfs:label "Hazard"@en ; "Hazard"@en ; "Set of inherent properties of a substance, mixture of substances, or a process involving substances that, under production, usage, or disposal conditions, make it capable of causing adverse effects to organisms or the environment, depending on the degree of exposure; in other words, it is a source of danger."@en . @@ -38561,7 +38550,7 @@ A detailed analysis of this spectrum is typically used to determine the identity ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Holder rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "An object which supports the specimen in the correct position for the characterisation process."@en ; rdfs:label "Holder"@en ; "Holder"@en ; "An object which supports the specimen in the correct position for the characterisation process."@en . @@ -38570,14 +38559,11 @@ A detailed analysis of this spectrum is typically used to determine the identity ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#HydrodynamicVoltammetry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" , - "A linear potential scan, at sufficiently slow scan rates so as to ensure a steady state response, is usually applied."@en , - "Mass transport of a redox species enhanced by convection in this way results in a greater electric current. Convective mass transfer occurs up to the diffusion-limiting layer, within which the mass transfer is controlled by diffusion. Electroactive substance depletion outside the diffusion layer is annulled by convective mass transfer, which results in steady- state sigmoidal wave-shaped current-potential curves."@en , - "The forced flow can be accomplished by movement either of the solution (solution stirring, or channel flow), or of the electrode (electrode rotation or vibration)."@en ; + rdfs:comment "Voltammetry with forced flow of the solution towards the electrode surface. A linear potential scan, at sufficiently slow scan rates so as to ensure a steady state response, is usually applied. Mass transport of a redox species enhanced by convection in this way results in a greater electric current. Convective mass transfer occurs up to the diffusion-limiting layer, within which the mass transfer is controlled by diffusion. Electroactive substance depletion outside the diffusion layer is annulled by convective mass transfer, which results in steady- state sigmoidal wave-shaped current-potential curves. The forced flow can be accomplished by movement either of the solution (solution stirring, or channel flow), or of the electrode (electrode rotation or vibration)."@en ; rdfs:label "HydrodynamicVoltammetry"@en ; "HydrodynamicVoltammetry"@en ; "https://www.wikidata.org/wiki/Q17028237" ; - "voltammetry with forced flow of the solution towards the electrode surface"@en ; + "Voltammetry with forced flow of the solution towards the electrode surface. A linear potential scan, at sufficiently slow scan rates so as to ensure a steady state response, is usually applied. Mass transport of a redox species enhanced by convection in this way results in a greater electric current. Convective mass transfer occurs up to the diffusion-limiting layer, within which the mass transfer is controlled by diffusion. Electroactive substance depletion outside the diffusion layer is annulled by convective mass transfer, which results in steady- state sigmoidal wave-shaped current-potential curves. The forced flow can be accomplished by movement either of the solution (solution stirring, or channel flow), or of the electrode (electrode rotation or vibration)."@en ; "https://en.wikipedia.org/wiki/Hydrodynamic_voltammetry"@en ; "https://doi.org/10.1515/pac-2018-0109"@en . @@ -38585,34 +38571,32 @@ A detailed analysis of this spectrum is typically used to determine the identity ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ICI rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Electrochemical method that measures the voltage response of an electrochemical cell under galvanostatic conditions to short interruptions in the current."@en ; rdfs:label "ICI"@en ; "IntermittentCurrentInterruptionMethod"@en ; "ICI"@en ; - "electrochemical method that measures the voltage response of an electrochemical cell under galvanostatic conditions to short interruptions in the current"@en . + "Electrochemical method that measures the voltage response of an electrochemical cell under galvanostatic conditions to short interruptions in the current."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Impedimetry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Measurement principle in which the complex electric impedance of a system is measured, usually as a function of a small amplitude sinusoidal electrode potential."@en ; rdfs:label "Impedimetry"@en ; "Impedimetry"@en ; - "measurement principle in which the complex electric impedance of a system is measured, usually as a function of a small amplitude sinusoidal electrode potential"@en ; + "Measurement principle in which the complex electric impedance of a system is measured, usually as a function of a small amplitude sinusoidal electrode potential."@en ; "https://doi.org/10.1515/pac-2018-0109"@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#InteractionVolume rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "The volume of material, and the surrounding environment, that interacts with the probe and generate a detectable (measurable) signal (information). In Scanning Electron Microscopy (SEM), the interaction volume is the volume of material that interacts directly with the incident electron beam, is usually much smaller than the entire specimen’s volume, and can be computed by using proper models. The interaction between the scanning probe and the sample generates a series of detectable signals (back scattered electrons, secondary electrons, x-rays, specimen current, etc.) which contain information on sample morphology, microstructure, composition, etc. In x-ray diffraction, the interaction volume is the volume of material that interacts directly with the x-ray beam and is usually smaller than the volume of the entire specimen. Depending on sample’s structure and microstructure, the interaction between the sample and the x-ray incident beam generates a secondary (reflected) beam that is measured by a detector and contains information on certain sample’s properties (e.g., crystallographic structure, phase composition, grain size, residual stress...). In some cases, (like tribological characterisations) the “sample” can also be the “probe”. When analysing a system of samples that interact each other, finding a clear definition can become a complex problem. It is important to note that, in some cases, the volume of interaction could be different from the volume of detectable signal emission. Example: in Scanning Electron Microscopy (SEM), the volume of interaction between the electron probe and the material is different from the volumes that generate the captured signal." ; rdfs:label "InteractionVolume"@en ; "InteractionVolume"@en ; "The volume of material, and the surrounding environment, that interacts with the probe and generate a detectable (measurable) signal (information)."@en ; - "In Scanning Electron Microscopy (SEM), the interaction volume is the volume of material that interacts directly with the incident electron beam, is usually much smaller than the entire specimen’s volume, and can be computed by using proper models. The interaction between the scanning probe and the sample generates a series of detectable signals (back scattered electrons, secondary electrons, x-rays, specimen current, etc.) which contain information on sample morphology, microstructure, composition, etc."@en , - "In x-ray diffraction, the interaction volume is the volume of material that interacts directly with the x-ray beam and is usually smaller than the volume of the entire specimen. Depending on sample’s structure and microstructure, the interaction between the sample and the x-ray incident beam generates a secondary (reflected) beam that is measured by a detector and contains information on certain sample’s properties (e.g., crystallographic structure, phase composition, grain size, residual stress, …)."@en ; - "In some cases, (like tribological characterisations) the “sample” can also be the “probe”. When analysing a system of samples that interact each other, finding a clear definition can become a complex problem."@en , - "It is important to note that, in some cases, the volume of interaction could be different from the volume of detectable signal emission. Example: in Scanning Electron Microscopy (SEM), the volume of interaction between the electron probe and the material is different from the volumes that generate the captured signal."@en . + "In Scanning Electron Microscopy (SEM), the interaction volume is the volume of material that interacts directly with the incident electron beam, is usually much smaller than the entire specimen’s volume, and can be computed by using proper models. The interaction between the scanning probe and the sample generates a series of detectable signals (back scattered electrons, secondary electrons, x-rays, specimen current, etc.) which contain information on sample morphology, microstructure, composition, etc. In x-ray diffraction, the interaction volume is the volume of material that interacts directly with the x-ray beam and is usually smaller than the volume of the entire specimen. Depending on sample’s structure and microstructure, the interaction between the sample and the x-ray incident beam generates a secondary (reflected) beam that is measured by a detector and contains information on certain sample’s properties (e.g., crystallographic structure, phase composition, grain size, residual stress...)."@en ; + "In some cases, (like tribological characterisations) the “sample” can also be the “probe”. When analysing a system of samples that interact each other, finding a clear definition can become a complex problem. It is important to note that, in some cases, the volume of interaction could be different from the volume of detectable signal emission. Example: in Scanning Electron Microscopy (SEM), the volume of interaction between the electron probe and the material is different from the volumes that generate the captured signal."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#IntermediateSample @@ -38626,7 +38610,7 @@ A detailed analysis of this spectrum is typically used to determine the identity ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#IonChromatography rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Ion chromatography (or ion-exchange chromatography) is a form of chromatography that separates ions and ionizable polar molecules based on their affinity to the ion exchanger."@en ; rdfs:label "IonChromatography"@en ; "IonChromatography"@en ; "Ion chromatography (or ion-exchange chromatography) is a form of chromatography that separates ions and ionizable polar molecules based on their affinity to the ion exchanger."@en ; @@ -38636,7 +38620,7 @@ A detailed analysis of this spectrum is typically used to determine the identity ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#IonMobilitySpectrometry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Ion mobility spectrometry (IMS) It is a method of conducting analytical research that separates and identifies ionized molecules present in the gas phase based on the mobility of the molecules in a carrier buffer gas. Even though it is used extensively for military or security objectives, such as detecting drugs and explosives, the technology also has many applications in laboratory analysis, including studying small and big biomolecules. IMS instruments are extremely sensitive stand-alone devices, but are often coupled with mass spectrometry, gas chromatography or high-performance liquid chromatography in order to achieve a multi-dimensional separation. They come in various sizes, ranging from a few millimeters to several meters depending on the specific application, and are capable of operating under a broad range of conditions. IMS instruments such as microscale high-field asymmetric-waveform ion mobility spectrometry can be palm-portable for use in a range of applications including volatile organic compound (VOC) monitoring, biological sample analysis, medical diagnosis and food quality monitoring."@en ; rdfs:label "IonMobilitySpectrometry"@en ; "IMS" ; "IonMobilitySpectrometry"@en ; @@ -38646,13 +38630,11 @@ A detailed analysis of this spectrum is typically used to determine the identity ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#IsothermalMicrocalorimetry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Isothermal microcalorimetry (IMC) is a laboratory method for real-time monitoring and dynamic analysis of chemical, physical and biological processes. Over a period of hours or days, IMC determines the onset, rate, extent and energetics of such processes for specimens in small ampoules (e.g. 3–20 ml) at a constant set temperature (c. 15 °C–150 °C). IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed time the net rate of heat flow (μJ/s = μW) to or from the specimen ampoule, and the cumulative amount of heat (J) consumed or produced."@en ; rdfs:label "IsothermalMicrocalorimetry"@en ; "IMC" ; "IsothermalMicrocalorimetry"@en ; - """Isothermal microcalorimetry (IMC) is a laboratory method for real-time monitoring and dynamic analysis of chemical, physical and biological processes. Over a period of hours or days, IMC determines the onset, rate, extent and energetics of such processes for specimens in small ampoules (e.g. 3–20 ml) at a constant set temperature (c. 15 °C–150 °C). - -IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed time the net rate of heat flow (μJ/s = μW) to or from the specimen ampoule, and the cumulative amount of heat (J) consumed or produced."""@en . + "Isothermal microcalorimetry (IMC) is a laboratory method for real-time monitoring and dynamic analysis of chemical, physical and biological processes. Over a period of hours or days, IMC determines the onset, rate, extent and energetics of such processes for specimens in small ampoules (e.g. 3–20 ml) at a constant set temperature (c. 15 °C–150 °C). IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed time the net rate of heat flow (μJ/s = μW) to or from the specimen ampoule, and the cumulative amount of heat (J) consumed or produced."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Laboratory @@ -38666,7 +38648,7 @@ IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed ti ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#LevelOfAutomation rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Describes the level of automation of the test."@en ; rdfs:label "LevelOfAutomation"@en ; "LevelOfAutomation"@en ; "Describes the level of automation of the test."@en . @@ -38675,7 +38657,7 @@ IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed ti ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#LevelOfExpertise rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Describes the level of expertise required to carry out a process (the entire test or the data processing)."@en ; rdfs:label "LevelOfExpertise"@en ; "LevelOfExpertise"@en ; "Describes the level of expertise required to carry out a process (the entire test or the data processing)."@en . @@ -38684,7 +38666,7 @@ IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed ti ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#LightScattering rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Light scattering is the way light behaves when it interacts with a medium that contains particles or the boundary between different mediums where defects or structures are present. It is different than the effects of refraction, where light undergoes a change in index of refraction as it passes from one medium to another, or reflection, where light reflects back into the same medium, both of which are governed by Snell’s law. Light scattering can be caused by factors such as the nature, texture, or specific structures of a surface and the presence of gas, liquid, or solid particles through which light propagates, as well as the nature of the light itself, of its wavelengths and polarization states. It usually results in diffuse light and can also affect the dispersion of color."@en ; rdfs:label "LightScattering"@en ; "LightScattering"@en ; "Light scattering is the way light behaves when it interacts with a medium that contains particles or the boundary between different mediums where defects or structures are present. It is different than the effects of refraction, where light undergoes a change in index of refraction as it passes from one medium to another, or reflection, where light reflects back into the same medium, both of which are governed by Snell’s law. Light scattering can be caused by factors such as the nature, texture, or specific structures of a surface and the presence of gas, liquid, or solid particles through which light propagates, as well as the nature of the light itself, of its wavelengths and polarization states. It usually results in diffuse light and can also affect the dispersion of color."@en . @@ -38693,10 +38675,11 @@ IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed ti ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#LinearChronopotentiometry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Chronopotentiometry where the applied current is changed linearly."@en ; rdfs:label "LinearChronopotentiometry"@en ; "LinearChronopotentiometry"@en ; - "chronopotentiometry where the applied current is changed linearly"@en . + "Chronopotentiometry where the applied current is changed linearly."@en , + "chronopotentiometry where the applied current is changed linearly"@en . [ rdf:type owl:Axiom ; owl:annotatedSource ; @@ -38709,17 +38692,14 @@ IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed ti ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#LinearScanVoltammetry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" , - "LSV corresponds to the first half cycle of cyclic voltammetry."@en , - "The peak current is expressed by the Randles-Ševčík equation."@en , - "The scan is usually started at a potential where no electrode reaction occurs."@en ; + rdfs:comment "Voltammetry in which the current is recorded as the electrode potential is varied linearly with time. LSV corresponds to the first half cycle of cyclic voltammetry. The peak current is expressed by the Randles-Ševčík equation. The scan is usually started at a potential where no electrode reaction occurs."@en ; rdfs:label "LinearScanVoltammetry"@en ; "LSV"@en , "LinearPolarization"@en , "LinearSweepVoltammetry"@en ; "LinearScanVoltammetry"@en ; "https://www.wikidata.org/wiki/Q620700" ; - "Voltammetry in which the current is recorded as the electrode potential is varied linearly with time."@en ; + "Voltammetry in which the current is recorded as the electrode potential is varied linearly with time. LSV corresponds to the first half cycle of cyclic voltammetry. The peak current is expressed by the Randles-Ševčík equation. The scan is usually started at a potential where no electrode reaction occurs."@en ; "https://en.wikipedia.org/wiki/Linear_sweep_voltammetry"^^xsd:anyURI ; "https://doi.org/10.1515/pac-2018-0109"@en . @@ -38727,7 +38707,7 @@ IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed ti ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MassSpectrometry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Mass spectrometry is a powerful analytical technique used to quantify known materials, to identify unknown compounds within a sample, and to elucidate the structure and chemical properties of different molecules."@en ; rdfs:label "MassSpectrometry"@en ; "MassSpectrometry"@en ; "Mass spectrometry is a powerful analytical technique used to quantify known materials, to identify unknown compounds within a sample, and to elucidate the structure and chemical properties of different molecules."@en . @@ -38735,70 +38715,58 @@ IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed ti ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MeasurementDataPostProcessing rdf:type owl:Class ; - rdfs:subClassOf ; - rdfs:comment "" ; - rdfs:label "MeasurementDataPostProcessing"@en ; "MeasurementDataPostProcessing"@en ; - "Application of a post-processing model to signals through a software, in order to calculate the final characterisation property."@en ; - "Analysis of SEM (or optical) images to gain additional information (image filtering/integration/averaging, microstructural analysis, grain size evaluation, Digital Image Correlation procedures, etc.)"@en , - "In nanoindentation testing, this is the Oliver-Pharr method, which allows calculating the elastic modulus and hardness of the sample by using the load and depth measured signals."@en . + "A class from CHAMEO"@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MeasurementParameter rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Describes the main input parameters that are needed to acquire the signal." ; rdfs:label "MeasurementParameter"@en ; "MeasurementParameter"@en ; - "Describes the main input parameters that are needed to acquire the signal"@en . + "Describes the main input parameters that are needed to acquire the signal."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MeasurementSystemAdjustment rdf:type owl:Class ; - rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:subClassOf , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] ; + rdfs:comment "Activity which has the goal of adjusting/tuning a measing instrument, without performing a measurement on a reference sample (which is a calibration). The output of this process can be a specific measurement parameter to be used in the characteriasation measurement process. From the International Vocabulary of Metrology (VIM): Set of operations carried out on a measuring system so that it provides prescribed indications corresponding to given values of a quantity being measured. NOTE 1: If there is any doubt that the context in which the term is being used is that of metrology, the long form “adjustment of a measuring system” might be used. NOTE 2: Types of adjustment of a measuring system include zero adjustment, offset adjustment, and span adjustment (sometimes called “gain adjustment”). NOTE 3: Adjustment of a measuring system should not be confused with calibration, which is sometimes a prerequisite for adjustment. NOTE 4: After an adjustment of a measuring system, the measuring system must usually be recalibrated." ; rdfs:label "MeasurementSystemAdjustment" ; + "MeasurementParameterAdjustment" ; "MeasurementSystemAdjustment" ; - """Set of operations carried out on a measuring system so that it provides prescribed indications corresponding to given values of a quantity being measured -NOTE 1 If there is any doubt that the context in which the term is being used is that of metrology, the long form -“adjustment of a measuring system” might be used. -NOTE 2 Types of adjustment of a measuring system include zero adjustment, offset adjustment, and span adjustment -(sometimes called “gain adjustment”). -NOTE 3 Adjustment of a measuring system should not be confused with calibration, which is sometimes a prerequisite -for adjustment. -NOTE 4 After an adjustment of a measuring system, the measuring system must usually be recalibrated. - --- International Vocabulary of Metrology(VIM)"""@en ; - """Activity which has the goal of adjusting/tuning a measing instrument, without performing a measurement on a reference sample (which is a calibration). -The output of this process can be a specific measurement parameter to be used in the characteriasation measurement process."""@en ; + "From the International Vocabulary of Metrology (VIM): Set of operations carried out on a measuring system so that it provides prescribed indications corresponding to given values of a quantity being measured. NOTE 1: If there is any doubt that the context in which the term is being used is that of metrology, the long form “adjustment of a measuring system” might be used. NOTE 2: Types of adjustment of a measuring system include zero adjustment, offset adjustment, and span adjustment (sometimes called “gain adjustment”). NOTE 3: Adjustment of a measuring system should not be confused with calibration, which is sometimes a prerequisite for adjustment. NOTE 4: After an adjustment of a measuring system, the measuring system must usually be recalibrated."@en ; + "Activity which has the goal of adjusting/tuning a measing instrument, without performing a measurement on a reference sample (which is a calibration). The output of this process can be a specific measurement parameter to be used in the characteriasation measurement process."@en ; "Adjustment"@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MeasurementTime rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "The overall time needed to acquire the measurement data." ; rdfs:label "MeasurementTime"@en ; "MeasurementTime"@en ; - "The overall time needed to acquire the measurement data"@en . + "The overall time needed to acquire the measurement data."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MechanicalTesting rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Mechanical testing covers a wide range of tests, which can be divided broadly into two types: 1. those that aim to determine a material's mechanical properties, independent of geometry; 2. those that determine the response of a structure to a given action, e.g. testing of composite beams, aircraft structures to destruction, etc."@en ; rdfs:label "MechanicalTesting"@en ; "MechanicalTesting"@en ; - """Mechanical testing covers a wide range of tests, which can be divided broadly into two types: -1. those that aim to determine a material's mechanical properties, independent of geometry. -2. those that determine the response of a structure to a given action, e.g. testing of composite beams, aircraft structures to destruction, etc."""@en ; + "Mechanical testing covers a wide range of tests, which can be divided broadly into two types: 1. those that aim to determine a material's mechanical properties, independent of geometry; 2. those that determine the response of a structure to a given action, e.g. testing of composite beams, aircraft structures to destruction, etc."@en ; "https://en.wikipedia.org/wiki/Mechanical_testing" . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MembraneOsmometry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "In the membrane osmometry technique, a pure solvent and polymer solution are separated by a semipermeable membrane, due to the higher chemical potential of the solvent in the pure solvent than in polymer solution, the solvent starts moving towards the polymer solution." ; rdfs:label "MembraneOsmometry"@en ; "MembraneOsmometry"@en ; "In the membrane osmometry technique, a pure solvent and polymer solution are separated by a semipermeable membrane, due to the higher chemical potential of the solvent in the pure solvent than in polymer solution, the solvent starts moving towards the polymer solution."@en . @@ -38807,25 +38775,47 @@ The output of this process can be a specific measurement parameter to be used in ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MercuryPorosimetry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "A method used to measure the pore size distribution and total pore volume of solid materials by infiltrating mercury into the pores under controlled pressure conditions and analyzing the amount of mercury intrusion." ; rdfs:label "MercuryPorosimetry"@en ; "MercuryPorosimetry"@en ; - "a method used to measure the pore size distribution and total pore volume of solid materials by infiltrating mercury into the pores under controlled pressure conditions and analyzing the amount of mercury intrusion"@en . + "A method used to measure the pore size distribution and total pore volume of solid materials by infiltrating mercury into the pores under controlled pressure conditions and analyzing the amount of mercury intrusion."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Microscopy rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Microscopy is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use photons, electrons, ions or physical cantilever probes to gather data about a sample's structure on a range of length scales." ; rdfs:label "Microscopy"@en ; "Microscopy"@en ; "Microscopy is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use photons, electrons, ions or physical cantilever probes to gather data about a sample's structure on a range of length scales."@en . +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Milling + rdf:type owl:Class ; + rdfs:subClassOf ; + rdfs:comment "Milling is a machining process that involves the use of a milling machine to remove material from a workpiece. Milling machines feature cutting blades that rotate while they press against the workpiece."@en ; + rdfs:label "Milling"@en ; + "Milling"@en ; + "Milling is a machining process that involves the use of a milling machine to remove material from a workpiece. Milling machines feature cutting blades that rotate while they press against the workpiece."@en . + + +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Mounting + rdf:type owl:Class ; + rdfs:subClassOf , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] ; + rdfs:comment "The sample is mounted on a holder." ; + rdfs:label "Mounting" ; + "Mounting" ; + "The sample is mounted on a holder."@en . + + ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Nanoindentation rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Nanoindentation (known also as nanoindentation test) is a method for testing the hardness and related mechanical properties of materials, facilitated by high-precision instrumentation in the nanometer scale, as well as analytical and computational algorithms for result evaluation. By definition, when someone performs nanoindentation, it refers to either quasistatic or continuous stiffness measurement. However, in reality with a nanoindenter it is also possible to perform scratch testing, scanning probe microscopy, and apply non-contact surface energy mapping, which can also be called nanoindentation, because they are measurements conducted using an nanoindenter." ; rdfs:label "Nanoindentation"@en ; "Nanoindentation"@en ; "Nanoindentation (known also as nanoindentation test) is a method for testing the hardness and related mechanical properties of materials, facilitated by high-precision instrumentation in the nanometer scale, as well as analytical and computational algorithms for result evaluation."@en ; @@ -38835,7 +38825,7 @@ The output of this process can be a specific measurement parameter to be used in ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#NeutronSpinEchoSpectroscopy rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Neutron spin echo spectroscopy is a high resolution inelastic neutron scattering method probing nanosecond dynamics. Neutron spin echo (NSE) spectroscopy uses the precession of neutron spins in a magnetic field to measure the energy transfer at the sample and decouples the energy resolution from beam characteristics like monochromatisation and collimation."@en ; rdfs:label "NeutronSpinEchoSpectroscopy"@en ; "NSE" ; "NeutronSpinEchoSpectroscopy"@en ; @@ -38845,7 +38835,7 @@ The output of this process can be a specific measurement parameter to be used in ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Nexafs rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Near edge X-ray absorption fine structure (NEXAFS), also known as X-ray absorption near edge structure (XANES), is a type of absorption spectroscopy that indicates the features in the X-ray absorption spectra (XAS) of condensed matter due to the photoabsorption cross section for electronic transitions from an atomic core level to final states in the energy region of 50–100 eV above the selected atomic core level ionization energy, where the wavelength of the photoelectron is larger than the interatomic distance between the absorbing atom and its first neighbour atoms."@en ; rdfs:label "Nexafs"@en ; "Nexafs"@en ; "Near edge X-ray absorption fine structure (NEXAFS), also known as X-ray absorption near edge structure (XANES), is a type of absorption spectroscopy that indicates the features in the X-ray absorption spectra (XAS) of condensed matter due to the photoabsorption cross section for electronic transitions from an atomic core level to final states in the energy region of 50–100 eV above the selected atomic core level ionization energy, where the wavelength of the photoelectron is larger than the interatomic distance between the absorbing atom and its first neighbour atoms."@en . @@ -38854,23 +38844,18 @@ The output of this process can be a specific measurement parameter to be used in ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#NormalPulseVoltammetry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" , - "Normal pulse polarography is NPV in which a dropping mercury electrode is used as the working electrode. A pulse is applied just before the mechanically enforced end of the drop. The pulse width is usually 10 to 20 % of the drop time. The drop dislodgment is synchro- nized with current sampling, which is carried out just before the end of the pulse, as in NPV."@en , - "Sigmoidal wave-shaped voltammograms are obtained."@en , - "The current is sampled at the end of the pulse and then plotted versus the potential of the pulse."@en , - "The current is sampled just before the end of the pulse, when the charging current is greatly diminished. In this way, the ratio of faradaic current to charging current is enhanced and the negative influence of charging current is partially eliminated. Due to the improved signal (faradaic current) to noise (charging current) ratio, the limit of detec- tion is lowered."@en , - "The sensitivity of NPV is not affected by the reversibility of the electrode reaction of the analyte."@en ; + rdfs:comment "Voltammetry in which potential pulses of amplitude increasing by a constant increment and with a pulse width of 2 to 200 ms are superimposed on a constant initial potential. Normal pulse polarography is NPV in which a dropping mercury electrode is used as the working electrode. A pulse is applied just before the mechanically enforced end of the drop. The pulse width is usually 10 to 20 % of the drop time. The drop dislodgment is synchro- nized with current sampling, which is carried out just before the end of the pulse, as in NPV. Sigmoidal wave-shaped voltammograms are obtained. The current is sampled at the end of the pulse and then plotted versus the potential of the pulse. The current is sampled just before the end of the pulse, when the charging current is greatly diminished. In this way, the ratio of faradaic current to charging current is enhanced and the negative influence of charging current is partially eliminated. Due to the improved signal (faradaic current) to noise (charging current) ratio, the limit of detec- tion is lowered. The sensitivity of NPV is not affected by the reversibility of the electrode reaction of the analyte."@en ; rdfs:label "NormalPulseVoltammetry"@en ; "NPV"@en ; "NormalPulseVoltammetry"@en ; - "voltammetry in which potential pulses of amplitude increasing by a constant increment and with a pulse width of 2 to 200 ms are superimposed on a constant initial potential"@en ; + "Voltammetry in which potential pulses of amplitude increasing by a constant increment and with a pulse width of 2 to 200 ms are superimposed on a constant initial potential. Normal pulse polarography is NPV in which a dropping mercury electrode is used as the working electrode. A pulse is applied just before the mechanically enforced end of the drop. The pulse width is usually 10 to 20 % of the drop time. The drop dislodgment is synchro- nized with current sampling, which is carried out just before the end of the pulse, as in NPV. Sigmoidal wave-shaped voltammograms are obtained. The current is sampled at the end of the pulse and then plotted versus the potential of the pulse. The current is sampled just before the end of the pulse, when the charging current is greatly diminished. In this way, the ratio of faradaic current to charging current is enhanced and the negative influence of charging current is partially eliminated. Due to the improved signal (faradaic current) to noise (charging current) ratio, the limit of detec- tion is lowered. The sensitivity of NPV is not affected by the reversibility of the electrode reaction of the analyte."@en ; "https://doi.org/10.1515/pac-2018-0109"@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#NuclearMagneticResonance rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Nuclear magnetic resonance spectroscopy, most commonly known as NMR spectroscopy or magnetic resonance spectroscopy (MRS), is a spectroscopic technique to observe local magnetic fields around atomic nuclei. This spectroscopy is based on the measurement of absorption of electromagnetic radiations in the radio frequency region from roughly 4 to 900 MHz. Absorption of radio waves in the presence of magnetic field is accompanied by a special type of nuclear transition, and for this reason, such type of spectroscopy is known as Nuclear Magnetic Resonance Spectroscopy. The sample is placed in a magnetic field and the NMR signal is produced by excitation of the nuclei sample with radio waves into nuclear magnetic resonance, which is detected with sensitive radio receivers. The intramolecular magnetic field around an atom in a molecule changes the resonance frequency, thus giving access to details of the electronic structure of a molecule and its individual functional groups. As the fields are unique or highly characteristic to individual compounds, in modern organic chemistry practice, NMR spectroscopy is the definitive method to identify monomolecular organic compounds."@en ; rdfs:label "NuclearMagneticResonance"@en ; "Magnetic resonance spectroscopy (MRS)" , "NMR" ; @@ -38881,11 +38866,11 @@ The output of this process can be a specific measurement parameter to be used in ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#OpenCircuitHold rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "A process in which the electric current is kept constant at 0 (i.e., open-circuit conditions)."@en ; rdfs:label "OpenCircuitHold"@en ; "OCVHold"@en ; "OpenCircuitHold"@en ; - "a process in which the electric current is kept constant at 0 (i.e., open-circuit conditions)"@en . + "A process in which the electric current is kept constant at 0 (i.e., open-circuit conditions)."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Operator @@ -38897,7 +38882,7 @@ The output of this process can be a specific measurement parameter to be used in ) ; rdf:type owl:Class ] ; - rdfs:comment "" ; + rdfs:comment "The human operator who takes care of the whole characterisation method or sub-processes/stages."@en ; rdfs:label "Operator"@en ; "Operator"@en ; "The human operator who takes care of the whole characterisation method or sub-processes/stages."@en . @@ -38906,10 +38891,10 @@ The output of this process can be a specific measurement parameter to be used in ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#OpticalMicroscopy rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Optical microscopy is a technique used to closely view a sample through the magnification of a lens with visible light."@en ; rdfs:label "OpticalMicroscopy"@en ; "OpticalMicroscopy"@en ; - "Optical microscopy is a technique used to closely view a sample through the magnification of a lens with visible light"@en . + "Optical microscopy is a technique used to closely view a sample through the magnification of a lens with visible light."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#OpticalTesting @@ -38923,16 +38908,24 @@ The output of this process can be a specific measurement parameter to be used in ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Osmometry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Osmometry is an advanced analytical method for determining the osmotic concentration of solutions. The osmotic – or solute – concentration of a colloidal system is expressed in osmoles (Osm) per unit of volume (Osm/L) or weight (Osm/kg)."@en ; rdfs:label "Osmometry"@en ; "Osmometry"@en ; "Osmometry is an advanced analytical method for determining the osmotic concentration of solutions. The osmotic – or solute – concentration of a colloidal system is expressed in osmoles (Osm) per unit of volume (Osm/L) or weight (Osm/kg)."@en . +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#OutlierRemoval + rdf:type owl:Class ; + rdfs:subClassOf ; + rdfs:comment "" ; + "OutlierRemoval" ; + "Outlier removal refers to the process of identifying and eliminating anomalous data points that deviate significantly from the overall pattern of a dataset. These outliers are generally considered to be observations that are unusually distant from other values and can potentially distort the results of analyses."@en . + + ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PhotoluminescenceMicroscopy rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Photoluminescence spectroscopy is a widely used technique for characterisation of the optical and electronic properties of semiconductors and molecules."@en ; rdfs:label "PhotoluminescenceMicroscopy"@en ; "PhotoluminescenceMicroscopy"@en ; "Photoluminescence spectroscopy is a widely used technique for characterisation of the optical and electronic properties of semiconductors and molecules."@en . @@ -38946,13 +38939,22 @@ The output of this process can be a specific measurement parameter to be used in ) ] ; - rdfs:comment "" ; + rdfs:comment "Set of physics principles (and associated governing equations) that describes the interaction between the sample and the probe. In x-ray diffraction, this is represented by the set of physics equations that describe the relation between the incident x-ray beam and the diffracted beam (the most simple form for this being the Bragg’s law)."@en ; rdfs:label "PhysicsOfInteraction"@en ; "PhysicsOfInteraction"@en ; "Set of physics principles (and associated governing equations) that describes the interaction between the sample and the probe."@en ; "In x-ray diffraction, this is represented by the set of physics equations that describe the relation between the incident x-ray beam and the diffracted beam (the most simple form for this being the Bragg’s law)."@en . +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Polishing + rdf:type owl:Class ; + rdfs:subClassOf ; + rdfs:comment "Polishing is a machining process to achieve a smooth surface of the Sample, which uses abrasive compounds with smal particles that are embedded in a pad or wheel."@en ; + rdfs:label "Polishing"@en ; + "Polishing"@en ; + "Polishing is a machining process to achieve a smooth surface of the Sample, which uses abrasive compounds with smal particles that are embedded in a pad or wheel."@en . + + ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Porosimetry rdf:type owl:Class ; rdfs:subClassOf ; @@ -38964,7 +38966,7 @@ The output of this process can be a specific measurement parameter to be used in ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PostProcessingModel rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Mathematical model used to process data. The PostProcessingModel use is mainly intended to get secondary data from primary data."@en ; rdfs:label "PostProcessingModel"@en ; "PostProcessingModel"@en ; "Mathematical model used to process data."@en ; @@ -38974,7 +38976,7 @@ The output of this process can be a specific measurement parameter to be used in ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PotentiometricStrippingAnalysis rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" , + rdfs:comment "Two-step electrochemical measurement in which 1) material is accumulated at an electrode and 2) the material is removed by chemical reaction or electrochemically at constant current with measurement of electrode potential. Historically for the analysis of metal ions, mercury ions were added to the test solution to form a mercury amalgam when reduced. Alternatively, an HMDE or MFE was used and the oxidizing agent added after amalgam formation. However, the toxicity of mercury and its compounds have all but precluded the present-day use of mercury. The accumulation is similar to that used in stripping voltammetry. The stripping potentiogram shows staircase curves of potential as a function of time. Frequently, the first derivative is displayed (dE/dt=f(t)), as this produces peak-shaped signals. The time between transitions (peaks) is proportional to the concentration of analyte in the test solution. The time between changes in potential in step 2 is related to the concentration of analyte in the solution."@en , "historically for the analysis of metal ions, mercury ions were added to the test solution to form a mercury amalgam when reduced. Alternatively, an HMDE or MFE was used and the oxidizing agent added after amalgam formation. However, the toxicity of mercury and its compounds have all but precluded the present-day use of mercury"@en , "the accumulation is similar to that used in stripping voltammetry"@en , "the stripping potentiogram shows staircase curves of potential as a function of time. Frequently, the first derivative is displayed (dE/dt=f(t)), as this produces peak-shaped signals. The time between transitions (peaks) is proportional to the concentration of analyte in the test solution"@en , @@ -38982,7 +38984,8 @@ The output of this process can be a specific measurement parameter to be used in rdfs:label "PotentiometricStrippingAnalysis"@en ; "PSA"@en ; "PotentiometricStrippingAnalysis"@en ; - "two-step electrochemical measurement in which 1) material is accumulated at an electrode and 2) the material is removed by chemical reaction or electrochemically at constant current with measurement of electrode potential"@en . + "Two-step electrochemical measurement in which 1) material is accumulated at an electrode and 2) the material is removed by chemical reaction or electrochemically at constant current with measurement of electrode potential. Historically for the analysis of metal ions, mercury ions were added to the test solution to form a mercury amalgam when reduced. Alternatively, an HMDE or MFE was used and the oxidizing agent added after amalgam formation. However, the toxicity of mercury and its compounds have all but precluded the present-day use of mercury. The accumulation is similar to that used in stripping voltammetry. The stripping potentiogram shows staircase curves of potential as a function of time. Frequently, the first derivative is displayed (dE/dt=f(t)), as this produces peak-shaped signals. The time between transitions (peaks) is proportional to the concentration of analyte in the test solution. The time between changes in potential in step 2 is related to the concentration of analyte in the solution."@en , + "two-step electrochemical measurement in which 1) material is accumulated at an electrode and 2) the material is removed by chemical reaction or electrochemically at constant current with measurement of electrode potential"@en . [ rdf:type owl:Axiom ; owl:annotatedSource ; @@ -39023,14 +39026,12 @@ The output of this process can be a specific measurement parameter to be used in ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Potentiometry rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" , - "For measurements using ion-selective electrodes, the measurement is made under equi- librium conditions what means that the macroscopic electric current is zero and the con- centrations of all species are uniform throughout the solution. The indicator electrode is in direct contact with the analyte solution, whereas the reference electrode is usually separated from the analyte solution by a salt bridge. The potential difference between the indicator and reference electrodes is normally directly proportional to the logarithm of the activity (concentration) of the analyte in the solution (Nernst equation). See also ion selec- tive electrode."@en , - "Method of electroanalytical chemistry based on measurement of an electrode potential."@en ; + rdfs:comment "Method of electroanalytical chemistry based on measurement of an electrode potential. Potentiometric methods are used to measure the electrochemical potentials of a metallic structure in a given environment. For measurements using ion-selective electrodes, the measurement is made under equilibrium conditions what means that the macroscopic electric current is zero and the concentrations of all species are uniform throughout the solution. The indicator electrode is in direct contact with the analyte solution, whereas the reference electrode is usually separated from the analyte solution by a salt bridge. The potential difference between the indicator and reference electrodes is normally directly proportional to the logarithm of the activity (concentration) of the analyte in the solution (Nernst equation). See also ion selective electrode."@en ; rdfs:label "Potentiometry"@en ; "Potentiometry"@en ; "https://www.wikidata.org/wiki/Q900632" ; "https://www.electropedia.org/iev/iev.nsf/display?openform&ievref=114-04-12" ; - "Potentiometric methods are used to measure the electrochemical potentials of a metallic structure in a given environment."@en ; + "Method of electroanalytical chemistry based on measurement of an electrode potential. Potentiometric methods are used to measure the electrochemical potentials of a metallic structure in a given environment. For measurements using ion-selective electrodes, the measurement is made under equilibrium conditions what means that the macroscopic electric current is zero and the concentrations of all species are uniform throughout the solution. The indicator electrode is in direct contact with the analyte solution, whereas the reference electrode is usually separated from the analyte solution by a salt bridge. The potential difference between the indicator and reference electrodes is normally directly proportional to the logarithm of the activity (concentration) of the analyte in the solution (Nernst equation). See also ion selective electrode."@en ; "https://doi.org/10.1515/pac-2018-0109"@en . @@ -39038,7 +39039,7 @@ The output of this process can be a specific measurement parameter to be used in rdf:type owl:Class ; rdfs:subClassOf ; owl:disjointWith ; - rdfs:comment "" ; + rdfs:comment "The sample after a preparation process."@en ; rdfs:label "PreparedSample" ; "PreparedSample" ; "The sample after a preparation process."@en . @@ -39047,13 +39048,11 @@ The output of this process can be a specific measurement parameter to be used in ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PrimaryData rdf:type owl:Class ; rdfs:subClassOf ; - rdfs:comment "" ; + rdfs:comment "Data resulting of a pre-processing of raw data, applying corrections to normalize/harmonize, in order to prepare them for the post-processing."@en ; rdfs:label "PrimaryData"@en ; "PrimaryData"@en ; "Data resulting of a pre-processing of raw data, applying corrections to normalize/harmonize, in order to prepare them for the post-processing."@en ; - "Baseline subtraction"@en , - "Noise reduction"@en , - "X and Y axes correction"@en . + "Baseline subtraction, noise reduction , X and Y axes correction."@en . ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Probe @@ -39074,6 +39073,14 @@ The output of this process can be a specific measurement parameter to be used in rdf:type owl:Class ; rdfs:subClassOf , , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , [ rdf:type owl:Restriction ; owl:onProperty ; owl:someValuesFrom @@ -39204,13 +39211,60 @@ materials – Selected terms and definitions, definition 2.1.1) for both measure rdfs:label "Sample"@en ; "Specimen" ; "Sample"@en ; - "Portion of material selected from a larger quantity of material. The term needs to be qualified, e.g., bulk sample, representative sample, primary sample, bulked sample, test sample, etc. The term 'sample' implies the existence of a sampling error, i.e., the results obtained on the portions taken are only estimates of the concentration of a constituent or the quantity of a property present in the parent material. If there is no or negligible sampling error, the portion removed is a test portion, aliquot, or specimen."@en ; + "Portion of material selected from a larger quantity of material. The term needs to be qualified, e.g., bulk sample, representative sample, primary sample, bulked sample, test sample, etc. The term 'sample' implies the existence of a sampling error, i.e., the results obtained on the portions taken are only estimates of the concentration of a constituent or the quantity of a property present in the parent material."@en ; "Sample and Specime are often used interchangeably. However in some cases the term Specimen is used to specify a portion taken under conditions such that the sampling variability cannot be assessed (usually because the population is changing), and is assumed, for convenience, to be zero." . +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleExtraction + rdf:type owl:Class ; + rdfs:subClassOf , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] ; + rdfs:comment "" ; + rdfs:label "SampleExtraction"@en ; + "SampleExtraction"@en ; + "Act of extracting a portion (amount) of material from a larger quantity of material. This operation results in obtaining a sample representative of the batch with respect to the property or properties being investigated."@en ; + "The term can be used to cover either a unit of supply or a portion for analysis. The portion taken may consist of one or more sub-samples and the batch may be the population from which the sample is taken."@en . + + +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleExtractionByCutting + rdf:type owl:Class ; + rdfs:subClassOf , + . + + +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleExtractionInstrument + rdf:type owl:Class ; + rdfs:subClassOf ; + rdfs:comment "" ; + "SampleExtractionInstrument" . + + ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleInspection rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] ; rdfs:comment "" ; rdfs:label "SampleInspection"@en ; "SampleInspection"@en ; @@ -39238,6 +39292,10 @@ materials – Selected terms and definitions, definition 2.1.1) for both measure ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplePreparation rdf:type owl:Class ; rdfs:subClassOf , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , [ rdf:type owl:Restriction ; owl:onProperty ; owl:someValuesFrom @@ -39256,6 +39314,12 @@ materials – Selected terms and definitions, definition 2.1.1) for both measure "Sample preparation processes (e.g., machining, polishing, cutting to size, etc.) before actual observation and measurement."@en . +### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplePreparationByCutting + rdf:type owl:Class ; + rdfs:subClassOf , + . + + ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplePreparationInstrument rdf:type owl:Class ; rdfs:subClassOf ; @@ -39285,16 +39349,6 @@ materials – Selected terms and definitions, definition 2.1.1) for both measure "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplingProcess - rdf:type owl:Class ; - rdfs:subClassOf ; - rdfs:comment "" ; - rdfs:label "SamplingProcess"@en ; - "SamplingProcess"@en ; - "Act of extracting a portion (amount) of material from a larger quantity of material. This operation results in obtaining a sample representative of the batch with respect to the property or properties being investigated."@en ; - "The term can be used to cover either a unit of supply or a portion for analysis. The portion taken may consist of one or more sub-samples and the batch may be the population from which the sample is taken."@en . - - ### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningAugerElectronMicroscopy rdf:type owl:Class ; rdfs:subClassOf ; @@ -47738,7 +47792,8 @@ materials – Selected terms and definitions, definition 2.1.1) for both measure ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_0afe79ed_dc0d_4b3e_88fa_ae0c7b1e88b5 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "PotassiumBasedElectrode"@en ; "an electrode in which the primary active material consists of potassium or potassium compounds"@en . @@ -47796,7 +47851,8 @@ materials – Selected terms and definitions, definition 2.1.1) for both measure ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_0d2aaaf4_1a8a_4a32_abd8_7d0fdf0ae9d2 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "NickelBasedElectrode"@en ; "an electrode in which the primary active material consists of nickel or nickel compounds"@en ; "often represented in IEC cell designations by the letter N"@en , @@ -47884,7 +47940,8 @@ materials – Selected terms and definitions, definition 2.1.1) for both measure ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_0ee59786_b090_444d_a46d_505797d07ca4 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "VanadiumBasedElectrode"@en ; "an electrode in which the primary active material consists of vanadium or vanadium compounds"@en ; "often represented in IEC cell designations by the letter V"@en , @@ -47893,6 +47950,7 @@ materials – Selected terms and definitions, definition 2.1.1) for both measure ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_0f007072_a8dd_4798_b865_1bf9363be627 rdf:type owl:Class ; + owl:equivalentClass ; rdfs:subClassOf , , [ rdf:type owl:Restriction ; @@ -47902,6 +47960,14 @@ materials – Selected terms and definitions, definition 2.1.1) for both measure [ rdf:type owl:Restriction ; owl:onProperty ; owl:someValuesFrom + ] , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom ] ; "Electrode"@en ; "https://www.wikidata.org/wiki/Q176140" ; @@ -48156,7 +48222,8 @@ materials – Selected terms and definitions, definition 2.1.1) for both measure ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_14377ecb_5ead_431e_831e_159d622bd0ea rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "RectangularElectrode"@en ; "an electrode in the shape of a rectangle"@en . @@ -48859,7 +48926,8 @@ Aluminum foil"""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_26b19a7c_59ca_4e1b_8fb9_ba061c22531e rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "CopperBasedElectrode"@en ; "an electrode in which the primary active material consists of copper or copper compounds"@en . @@ -48997,7 +49065,8 @@ Aluminum foil"""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_2a177462_ff01_4b83_ab9f_032e93c9ec69 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "MagnesiumBasedElectrode"@en ; "an electrode in which the primary active material consists of magnesium or magnesium compounds"@en . @@ -49469,7 +49538,8 @@ Aluminum foil"""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_35c650ab_3b23_4938_b312_1b0dede2e6d5 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "Cathode"@en ; "https://www.wikidata.org/wiki/Q175233" ; "https://dbpedia.org/page/Cathode"@en ; @@ -49520,7 +49590,8 @@ Aluminum foil"""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_3663991d_9319_4f7a_922b_f0e428b58801 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "PorousElectrode"@en ; "porous electrodes consist of porous matrices of a single reactive electronic conductor or a mixture of solids that include essentially non-conducting, reactive materials in addition to electronic conductors. An electrolytic solution fills the void spaces of the porous matrix."@en . @@ -49616,7 +49687,8 @@ Aluminum foil"""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_399b10cd_8a2e_47be_96b8_295890bd2460 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "RhodiumBasedElectrode"@en ; "an electrode in which the primary active material consists of rhodium or rhodium compounds"@en . @@ -49760,7 +49832,8 @@ Aluminum foil"""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_3e6a7d5f_3700_46b3_b1b8_f34e37e6f931 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "IridiumBasedElectrode"@en ; "an electrode in which the primary active material consists of iridium or iridium compounds"@en . @@ -49876,7 +49949,21 @@ Aluminum foil"""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_403c300e_09b9_400b_943b_04e82a3cfb56 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + , + , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] , + [ rdf:type owl:Restriction ; + owl:onProperty ; + owl:someValuesFrom + ] ; "ElectrodeCoating"@en ; "an electrode which is coated onto a substrate, typically a metallic foil current collector."@en . @@ -50097,7 +50184,8 @@ Aluminum foil"""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_468b3b63_b62a_4110_8c7e_40fffd5fdfd6 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "ManganesePhosphateBasedElectrode"@en ; "an electrode in which the primary active material consists of manganese phosphate or manganese phosphate compounds"@en ; "often represented in cell designations by the letter Mp"@en , @@ -50113,7 +50201,8 @@ Aluminum foil"""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_46ac0fd3_2b8e_40aa_bf5d_19cf1dd39052 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "StrontiumBasedElectrode"@en ; "an electrode in which the primary active material consists of strontium or strontium compounds"@en . @@ -50136,7 +50225,8 @@ Aluminum foil"""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_47346d85_b9be_4480_8993_6307b1c58fcd rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "LithiumBasedElectrode"@en ; "an electrode in which the primary active material consists of lithium or lithium compounds"@en . @@ -50556,7 +50646,8 @@ The real (true) area, A_{real}, takes into account non-idealities of the interfa ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_4f2348dd_d9ea_4448_af8c_a4a38f3d04b4 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "CalciumBasedElectrode"@en ; "an electrode in which the primary active material consists of calcium or calcium compounds"@en . @@ -50626,14 +50717,16 @@ The real (true) area, A_{real}, takes into account non-idealities of the interfa ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_510e4061_c4fa_49aa_a052_23ad56098eda rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "ChromiumBasedElectrode"@en ; "an electrode in which the primary active material consists of chromium or chromium compounds"@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_5186239a_2af7_4dbf_92ca_22e8e583c528 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "BlendedActiveElectrode"@en ; "an active electrode with a blend of two or more active materials"@en . @@ -50667,7 +50760,8 @@ The real (true) area, A_{real}, takes into account non-idealities of the interfa ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_52547692_f773_4e3f_8c8b_1d9d39bc3c8c rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "GoldBasedElectrode"@en ; "an electrode in which the primary active material consists of gold or gold compounds"@en . @@ -51030,7 +51124,8 @@ The real (true) area, A_{real}, takes into account non-idealities of the interfa ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_5adb91e0_ffe1_41f3_b779_c6966f65fb0e rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "MetalElectrode"@en ; "an electrode in which the actve electrochemical material is a metal"@en ; "the term metal is meant to loosely cover alkali metals, alkaline earth metals, transition metals, post-transition metals, and metalloids"@en . @@ -51100,7 +51195,8 @@ The real (true) area, A_{real}, takes into account non-idealities of the interfa ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_5e1136d3_df00_40f7_a4bc_8259341053a1 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "IronBasedElectrode"@en ; "an electrode which contains mostly materials based on iron"@en ; "often represented in cell designations by the letter F"@en , @@ -51248,7 +51344,8 @@ The real (true) area, A_{real}, takes into account non-idealities of the interfa ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_610f0bc8_557d_455b_a8ed_272d5d1813c9 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "LeadBasedElectrode"@en ; "an electrode in which the primary active material consists of lead or lead compounds"@en . @@ -51793,7 +51890,8 @@ The real (true) area, A_{real}, takes into account non-idealities of the interfa ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_757eae08_4d43_42d4_8b4e_8a0bfd2f9a1c rdf:type owl:Class ; - rdfs:subClassOf , + rdfs:subClassOf , + , [ rdf:type owl:Restriction ; owl:onProperty ; owl:someValuesFrom @@ -52092,14 +52190,16 @@ Cl2, Hg | Hg2SO4, and Hg | HgO, can be used as reference electrodes in aqueous s ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_79e12290_d1e5_4c41_916c_18f1e4d7fb51 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "SiliconBasedElectrode"@en ; "an electrode in which the primary active material consists of silicon or silicon compounds"@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_7b811780_7251_481b_a4d3_97d437955099 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; owl:deprecated "true"^^xsd:boolean ; "CobaltBasedElectrode"@en ; "an electrode in which the primary active material consists of cobalt or cobalt compounds"@en . @@ -52107,7 +52207,8 @@ Cl2, Hg | Hg2SO4, and Hg | HgO, can be used as reference electrodes in aqueous s ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_7b9db6b3_36f0_4b5d_acbb_9284a9054a09 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "IndiumBasedElectrode"@en ; "an electrode in which the primary active material consists of indium or indium compounds"@en . @@ -52122,7 +52223,8 @@ Cl2, Hg | Hg2SO4, and Hg | HgO, can be used as reference electrodes in aqueous s ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_7cc8b738_3462_4592_ba83_951a8d50fef7 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "CaesiumBasedElectrode"@en ; "an electrode in which the primary active material consists of caesium or caesium compounds"@en . @@ -52286,7 +52388,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_7ffe1cb6_f87e_4b4a_8ce7_c98e2a584cb1 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "RutheniumBasedElectrode"@en ; "an electrode in which the primary active material consists of ruthenium or ruthenium compounds"@en . @@ -52451,7 +52554,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_838c115b_6bc9_4ce8_9f8d_86a6bf67742a rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "CobaltBasedElectrode"@en ; "an electrode which contains mostly materials based on cobalt"@en ; "often represented in IEC cell designations by the letter C"@en , @@ -52633,7 +52737,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_871bc4a4_2d17_4b88_9b0f_7ab85f14afea rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "AuxiliaryElectrode"@en ; "CounterElectrode"@en ; "https://www.wikidata.org/wiki/Q1768785" ; @@ -52725,7 +52830,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_88d2d4bc_4244_4419_a260_ad099a62d580 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "SulfurBasedElectrode"@en ; "an electrode in which the primary active material consists of sulfur or sulfur compounds"@en . @@ -53032,6 +53138,7 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_92147e31_d015_4889_a092_04fbab033f15 rdf:type owl:Class ; rdfs:subClassOf , + , [ rdf:type owl:Restriction ; owl:onProperty ; owl:someValuesFrom @@ -53114,7 +53221,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_952c8c3a_df21_4dd1_8d8c_380e43dc8c78 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "AluminiumBasedElectrode"@en ; "an electrode in which the primary active material consists of aluminium or aluminium compounds"@en . @@ -53263,7 +53371,9 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_9a823d64_9d10_4a29_9cbd_9bbdad7985bc rdf:type owl:Class ; - rdfs:subClassOf , + rdfs:subClassOf , + , + , [ rdf:type owl:Restriction ; owl:onProperty ; owl:someValuesFrom @@ -53332,7 +53442,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_9c557caa_61e2_4fa9_a517_4bad01a68122 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "TitaniumBasedElectrode"@en ; "an electrode in which the primary active material consists of titanium or titanium compounds"@en ; "often represented in cell designations by the letter T"@en , @@ -53471,7 +53582,9 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_9d97c7ff_b0c7_4ba2_a3cb_c6509b6798a8 rdf:type owl:Class ; - rdfs:subClassOf , + rdfs:subClassOf , + , + , [ rdf:type owl:Restriction ; owl:onProperty ; owl:someValuesFrom @@ -53588,7 +53701,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_9f466223_e20a_474d_ac4d_6d4b6131c275 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "NonPolarizableElectrode"@en ; "an electrode that holds its potential essentially constant by efficiently allowing electric current to pass"@en ; "this is a desirable characteristic for a reference electrode"@en . @@ -53646,7 +53760,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_a0a619d7_da95_41f0_8bc3_9c19d636d543 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "InertElectrode"@en ; "https://www.wikidata.org/wiki/Q120907475" ; "https://www.electropedia.org/iev/iev.nsf/display?openform&ievref=114-02-08"@en ; @@ -53686,7 +53801,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_a10ede13_c895_4f56_a728_b1aab512b31b rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "TinBasedElectrode"@en ; "an electrode in which the primary active material consists of tin or tin compounds"@en . @@ -54090,7 +54206,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_a8bfac4f_3f30_4e6d_8d8e_34b1eeecb614 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "RoundElectrode"@en ; "an electrode in the shape of a circle"@en . @@ -54417,7 +54534,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_aff732a9_238a_4734_977c_b2ba202af126 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "PositivePlate"@en ; "PositiveElectrode"@en ; "https://www.wikidata.org/wiki/Q120907518" ; @@ -54462,7 +54580,8 @@ G° or ΔrG , written as a reduction with respect to that of the standard hydrog ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_b1ac8d0c_a215_4e60_82b0_38272eff5131 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "ManganeseBasedElectrode"@en ; "an electrode in which the primary active material consists of manganese or manganese compounds"@en ; "often represented in cell designations by the letter M"@en , @@ -54616,7 +54735,8 @@ of other configurations are used."""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_b6319c74_d2ce_48c0_a75a_63156776b302 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "Anode"@en ; "https://www.wikidata.org/wiki/Q181232"@en ; "https://www.electropedia.org/iev/iev.nsf/display?openform&ievref=482-02-27" ; @@ -55139,7 +55259,8 @@ of other configurations are used."""@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_c2024587_3237_474e_8df9_91d10db2df47 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "PolarizableElectrode"@en ; "electrode whose potential changes with an applied potential"@en . @@ -55332,7 +55453,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_c5fd7b61_40f1_4225_a173_5caa3c5f4773 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "TungstenBasedElectrode"@en ; "an electrode in which the primary active material consists of tungsten or tungsten compounds"@en . @@ -55502,7 +55624,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_c94c041b_8ea6_43e7_85cc_d2bce7785b4c rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "NegativePlate"@en ; "NegativeElectrode"@en ; "https://www.wikidata.org/wiki/Q120907506" ; @@ -55627,7 +55750,9 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_cbb95634_450c_4332_980c_d37baadd7619 rdf:type owl:Class ; - rdfs:subClassOf , + rdfs:subClassOf , + , + , [ rdf:type owl:Restriction ; owl:onProperty ; owl:someValuesFrom @@ -55678,7 +55803,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_cc4e178c_bc1f_4502_b6c2_33f304ef6bab rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; owl:deprecated "true"^^xsd:boolean ; "IronBasedElectrode"@en ; "an electrode in which the primary active material consists of iron or iron compounds"@en . @@ -55806,7 +55932,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_d0a26dc2_fde9_4a11_ac26_7c18499d28a5 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "ZincBasedElectrode"@en ; "an electrode in which the primary active material consists of zinc or zinc compounds"@en . @@ -55963,7 +56090,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_d54f6aac_7cd2_4d52_9bca_2f19bb1eaec4 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "IronPhosphateBasedElectrode"@en ; "an electrode in which the primary active material consists of iron phosphate or iron phosphate compounds"@en ; "represented in IEC cell designations by the letter code Fp"@en . @@ -56079,14 +56207,16 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_d8a9a88e_d437_4fef_bc3c_65a1fe627061 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "PlatinumBasedElectrode"@en ; "an electrode in which the primary active material consists of platinum or platinum compounds"@en . ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_d90221a0_0da7_4876_9cac_0e943e445f6f rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; owl:deprecated "true"^^xsd:boolean ; "TitaniumBasedElectrode"@en ; "an electrode in which the primary active material consists of titanium or titanium compounds"@en . @@ -56228,7 +56358,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_dd4c5ffa_6228_41d8_8a44_a40a2b22723e rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "CadmiumBasedElectrode"@en ; "an electrode in which the primary active material consists of cadmium or cadmium compounds."@en . @@ -56250,7 +56381,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_df4dd678_9642_47c9_84dd_4bb09f369f53 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "SodiumBasedElectrode"@en ; "an electrode in which the primary active material consists of sodium or sodium compounds"@en . @@ -56479,7 +56611,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_e4b6cb36_4dac_49e3_871d_40bcfca943a5 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "MetalOxideElectrode"@en ; "electrode in which the active material is a metal oxide"@en . @@ -56694,7 +56827,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_eb09ca25_90c9_4b55_9165_76fbf7fb5a46 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "BismuthBasedElectrode"@en ; "an electrode in which the primary active material consists of bismuth or bismuth compounds."@en . @@ -56921,7 +57055,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_f2c33088_224f_4fdb_857a_7cb62e3dddca rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "CarbonBasedElectrode"@en ; "an electrode in which the primary active material consists of carbon or carbon compounds"@en ; "often represented in IEC cell designations by the letter I"@en , @@ -57198,7 +57333,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_f6fcd255_248d_4603_b128_04dab960a676 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "IndicatorElectrode"@en ; "https://www.wikidata.org/wiki/Q120907462" ; "electrode that responds to one, or more than one, species in the solution being investigated, with no appreciable change of bulk solution composition during the measurement"@en ; @@ -57232,7 +57368,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_f897db90_afd6_42e7_8d1f_0fcba856e45a rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "SilverBasedElectrode"@en ; "an electrode in which the primary active material consists of silver or silver compounds"@en . @@ -57307,7 +57444,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_f9f056bb_a38b_43bd_a6bd_99d618431f4d rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "PalladiumBasedElectrode"@en ; "an electrode in which the primary active material consists of palladium or palladium compounds"@en . @@ -57406,7 +57544,8 @@ In either case, the magnitude of the catalytic current depends on the applied po ### https://w3id.org/emmo/domain/electrochemistry#electrochemistry_fb988878_ee54_4350_9ee9_228c00c3ad35 rdf:type owl:Class ; - rdfs:subClassOf ; + rdfs:subClassOf , + ; "WorkingElectrode"@en ; "https://www.wikidata.org/wiki/Q477099" ; "electrode at which one or more electroactive substances undergo reaction in the solution being investigated"@en ; @@ -57547,17 +57686,6 @@ In either case, the magnitude of the catalytic current depends on the applied po # Individuals ################################################################# -### http://ext.org/LoadDisplacementCurve1 - rdf:type owl:NamedIndividual , - , - , - , - , - , - , - . - - ### https://orcid.org/0000-0001-8869-3718 rdf:type owl:NamedIndividual , , @@ -57671,28 +57799,25 @@ In either case, the magnitude of the catalytic current depends on the applied po "The universe is considered as a causally self-connected object, encompassing all other objects. For this reason is unique."@en . -[ owl:minQualifiedCardinality "1"^^xsd:nonNegativeInteger +[ owl:qualifiedCardinality "1"^^xsd:nonNegativeInteger ] . [ owl:qualifiedCardinality "1"^^xsd:nonNegativeInteger ] . -[ owl:minQualifiedCardinality "2"^^xsd:nonNegativeInteger +[ owl:minQualifiedCardinality "1"^^xsd:nonNegativeInteger ] . [ owl:qualifiedCardinality "1"^^xsd:nonNegativeInteger ] . -[ owl:qualifiedCardinality "1"^^xsd:nonNegativeInteger +[ owl:minQualifiedCardinality "1"^^xsd:nonNegativeInteger ] . [ owl:qualifiedCardinality "1"^^xsd:nonNegativeInteger ] . -[ owl:minQualifiedCardinality "1"^^xsd:nonNegativeInteger - ] . - -[ owl:qualifiedCardinality "4"^^xsd:nonNegativeInteger +[ owl:minQualifiedCardinality "2"^^xsd:nonNegativeInteger ] . [ owl:qualifiedCardinality "1"^^xsd:nonNegativeInteger @@ -57701,6 +57826,9 @@ In either case, the magnitude of the catalytic current depends on the applied po [ owl:qualifiedCardinality "3"^^xsd:nonNegativeInteger ] . +[ owl:qualifiedCardinality "4"^^xsd:nonNegativeInteger + ] . + [ owl:qualifiedCardinality "1"^^xsd:nonNegativeInteger ] . @@ -57754,6 +57882,14 @@ In either case, the magnitude of the catalytic current depends on the applied po # General axioms ################################################################# +[ rdf:type owl:AllDisjointClasses ; + owl:members ( + + + ) +] . + + [ rdf:type owl:AllDisjointClasses ; owl:members ( @@ -57761,9 +57897,9 @@ In either case, the magnitude of the catalytic current depends on the applied po + - ) ] . diff --git a/battery.ttl b/battery.ttl index db8a1c4..ebd87f0 100644 --- a/battery.ttl +++ b/battery.ttl @@ -17,9 +17,9 @@ @base . rdf:type owl:Ontology ; - owl:versionIRI ; - owl:imports , - ; + owl:versionIRI ; + owl:imports , + ; dcterms:abstract "The Battery Domain Ontology, a specialized domain within the Elementary Multiperspective Materials Ontology (EMMO), encompasses essential terms and relationships for battery components, cells, interfaces, methods, models, and data. Its primary objective is to enable the creation of linked and FAIR (Findable, Accessible, Interoperable, and Reusable) data, thereby fostering advancements in research and innovation within the realm of batteries. This ontology serves as a foundational resource for harmonizing battery knowledge representation, enhancing data interoperability, and accelerating progress in battery research and development." ; dcterms:bibliographicCitation "https://zenodo.org/doi/10.5281/zenodo.7693672" ; dcterms:contributor , diff --git a/catalog-v001.xml b/catalog-v001.xml index 7cd144b..1d5046a 100644 --- a/catalog-v001.xml +++ b/catalog-v001.xml @@ -1,12 +1,12 @@ - - + + - - - + + + diff --git a/shared/battery-quantities.ttl b/shared/battery-quantities.ttl index f9ee0ad..49b8adf 100644 --- a/shared/battery-quantities.ttl +++ b/shared/battery-quantities.ttl @@ -12,8 +12,8 @@ @base . rdf:type owl:Ontology ; - owl:versionIRI ; - owl:imports ; + owl:versionIRI ; + owl:imports ; dcterms:abstract "This battery quantities ontology is a domain of the Elementary Multiperspective Materials Ontology (EMMO). It is a specialized framework designed to represent and organize knowledge about battery quantities. It is designed to integrate with the battery domain ontology or other ontologies from the EMMO ecosystem. The main focus of this ontology is to provide machine-readable descriptions of common battery quantities, linking both to the larger descriptions of physical quantities in EMMO as well as other sources of information like the IEC, QUDT, Wikidata, etc. It should be used to support linked data generation in the battery domain."@en ; dcterms:contributor "Casper Welzel Andersen" , "Francesca Lonstad Bleken" , diff --git a/shared/catalog-v001.xml b/shared/catalog-v001.xml index 545e3f7..564df25 100644 --- a/shared/catalog-v001.xml +++ b/shared/catalog-v001.xml @@ -1,11 +1,11 @@ - - + + - - + +