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This repository has been archived by the owner on Feb 12, 2021. It is now read-only.
Right now we always using smearing parameters for metals, but we want to be able to easily do semiconductors or insulators too.
There's a question of how to handle this once we have detected that we are dealing with a material with/without a bandgap (after the relaxation)
Perhaps there should also be a "force" option, in the case that the user knows better for some reason.
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