diff --git a/contributed_definitions/NXmpes_peem.nxdl.xml b/contributed_definitions/NXmpes_peem.nxdl.xml index e5b551dc1f..6708bba106 100644 --- a/contributed_definitions/NXmpes_peem.nxdl.xml +++ b/contributed_definitions/NXmpes_peem.nxdl.xml @@ -21,7 +21,7 @@ # # For further information, see http://www.nexusformat.org --> - + This is a general application definition for a photo-electron emission or low energy electron microscopy/diffraction experiment. @@ -33,22 +33,34 @@ - + + + contains field named in the **flux** attribute of :ref:`NXbeam` + + - + - - + + + this should be a link to monochromator energy + + + + + use this or **incident_polarization** + + - + default is [0,0,1] - + defined as normal to the plane used to measure azimuth. Default is [0,1,0] through the origin @@ -57,41 +69,17 @@ - + One or two values for size of image on sample or in another space along slow and fast pixel dimensions. - - + - - - Scheme of the electron collection column. - - - - - - - - - - - - - - - - - - Labelling of the lens setting in use - - The space projected in the angularly dispersive direction @@ -102,7 +90,7 @@ - + list of electromagnetic lenses of the microscope column. @@ -110,29 +98,17 @@ - + - - - Size, position and shape of the entrance slit in dispersive analyzers. To add - additional or other slits use an APERTURE group in this group. - - - - - Size, position and shape of the exit slit in dispersive analyzers. To add - additional or other slits use an APERTURE group in this group. - - - + only in dispersive mode - + Center of the energy window (only in dispersive mode) @@ -152,7 +128,7 @@ - external link to a dark image file. + external link to a dark image. @@ -172,7 +148,7 @@ - + Start voltage (sample retarding potential). @@ -188,14 +164,5 @@ orientation if necessary. - - - - - The origin is at the sample position in the center of the detector field of - view, with all the manipulator positioners set to zero. - - - diff --git a/contributed_definitions/yaml/NXmpes_peem.yaml b/contributed_definitions/nyaml/NXmpes_peem.yaml similarity index 67% rename from contributed_definitions/yaml/NXmpes_peem.yaml rename to contributed_definitions/nyaml/NXmpes_peem.yaml index ebfe682fdf..c732fab69c 100644 --- a/contributed_definitions/yaml/NXmpes_peem.yaml +++ b/contributed_definitions/nyaml/NXmpes_peem.yaml @@ -1,78 +1,76 @@ -category: application doc: | This is a general application definition for a photo-electron emission or low energy electron microscopy/diffraction experiment. -type: group -(NXmpes)NXmpes_peem: +category: application +NXmpes_peem(NXmpes): (NXentry): definition: \@version: enumeration: [NXmpes_peem] (NXmonitor): exists: recommended + doc: contains field named in the **flux** attribute of :ref:`NXbeam` (NXinstrument): (NXinsertion_device): exists: optional # only when PEEM uses synchrotron light (NXmonochromator): # incoming_beam_monochromator exists: recommended - (NXbeam)beam_probe: + beam_probe(NXbeam): exists: optional # as we record it in NXsample \@flux: # that will point to the NXmonitor data field - incident_energy(NX_FLOAT): # link to monochromator energy + incident_energy(NX_FLOAT): + units: NX_ENERGY + doc: this should be a link to monochromator energy incident_polarization_stokes(NX_NUMBER): + exists: recommended + doc: use this or **incident_polarization** depends_on: (NXtransformations): direction(NX_number): + exists: recommended doc: default is [0,0,1] reference_plane(NX_NUMBER): #how is that for our AC-PEEM? - doc: - defined as normal to the plane used to measure azimuth. Default is [0,1,0] through the origin + exists: recommended + doc: + defined as normal to the plane used to measure azimuth. Default is [0,1,0] through the origin (NXoptical_system_em): field_of_view(NX_FLOAT): - doc: | + units: NX_LENGTH + doc: One or two values for size of image on sample or in another space along slow and fast pixel dimensions. - \@units: working_distance(NX_FLOAT): + units: NX_LENGTH magnification(NX_FLOAT): (NXelectronanalyser): (NXcollectioncolumn): # supplement base application definition - scheme: - doc: | - Scheme of the electron collection column. - enumeration: [standard, angular dispersive, selective area, deflector, PEEM, PEEM dark-field, LEEM, LEEM dark-field, LEED, dispersive plane, momentum microscope] - mode: - exists: recommended - doc: - Labelling of the lens setting in use + scheme: + doc: | + Scheme of the electron collection column. + enumeration: [standard, angular dispersive, selective area, deflector, PEEM, PEEM dark-field, LEEM, LEEM dark-field, LEED, dispersive plane, momentum microscope] projection: doc: The space projected in the angularly dispersive direction enumeration: [real, reciprocal, energy] - extractor_voltage(NXlens_em): + extractor_voltage(NX_FLOAT): + units: NX_VOLTAGE objective_lens(NXlens_em): doc: list of electromagnetic lenses of the microscope column. # other EM lenses in column - (NXebeam_column)electron_gun: + electron_gun(NXebeam_column): exists: optional # when doing LEEM/LEED field_aperture(NXaperture_em): beam(NXbeam): (NXenergydispersion): exists: optional - entrance_slit(NXaperture_em): # changed from NXaperture - exists: optional - doc: | - Size, position and shape of the entrance slit in dispersive analyzers. To add - additional or other slits use an APERTURE group in this group. - exit_slit(NXaperture_em): # changed from NXaperture - exists: optional - doc: | - Size, position and shape of the exit slit in dispersive analyzers. To add - additional or other slits use an APERTURE group in this group. energy_interval(NX_FLOAT): + exists: optional + units: NX_ENERGY doc: only in dispersive mode center_energy(NX_FLOAT): + exists: optional + units: NX_ENERGY doc: Center of the energy window (only in dispersive mode) (NXdetector): @@ -85,19 +83,20 @@ type: group For detectors with irregular pixel sizes or composed by modules tiled together. dark_image(NX_NUMBER): doc: - external link to a dark image file. + external link to a dark image. flatfield_image(NX_NUMBER): doc: external link to a flat field image. data(NX_NUMBER): (NXmanipulator): - doc: | + doc: Manipulator for positioning and rotating of the sample. (NXpositioner): - doc: | + doc: One of a group of sample positioners # other NXpositioners sample_bias(NX_FLOAT): + units: NX_VOLTAGE doc: Start voltage (sample retarding potential). coordinate_system_set(NXcoordinate_system_set): @@ -106,9 +105,9 @@ type: group be the sample with all the positioner set to zero. Define at least the beam reference at sample position and the gravity direction. Add the crystal cell orientation if necessary. - (NXsample): - depends_on: - (NXtransformations): # links to fields in NXmanipulator - doc: - The origin is at the sample position in the center of the detector field of view, - with all the manipulator positioners set to zero. + (NXsample): + depends_on: + (NXtransformations): # links to fields in NXmanipulator + doc: + The origin is at the sample position in the center of the detector field of view, + with all the manipulator positioners set to zero.