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Single-pass test planning #1982

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pshirshov opened this issue Jul 5, 2023 · 0 comments

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complex distage (di) distage-testkit enhancement

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pshirshov commented Jul 5, 2023

We might significantly simplify the test planner if using the following approach:

Everything is memoized by default
The user specifies "forking points" - non-memoized components, all the subgraphs after these components must be instantiated per test

This way we should be able to complete test planning in a single pass and the odd concept of memoization levels would be gone.

pshirshov added enhancement distage (di) distage-testkit complex labels

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